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  • 學位論文

探討半導體金屬化製程之金屬鉭薄膜的沉積與化學添加劑對銅沉積之影響

The Study of Magnetron Sputtering Tantalum and the Effect of Chemical Additive on Cu Electroplating.

指導教授 : 鄭俊麟
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摘要


在未來半導體金屬化製程中,鉭金屬與銅金屬將扮演非常重要的角色。由於鉭金屬具有極高的熔點,是一良好的耐火材料,因此已被考慮作為障礙金屬層之用。此外,銅金屬相對於鋁金屬由於其具有較低的電阻係數以及較高的抗電子遷移能力,因此亦被考慮作為未來金屬導線之用。相較於傳統真空鍍膜沉積法,由於化學電鍍銅技術具有低溫製程、低成本、高沉積速率及製程簡單等優點,已經成為未來沉積銅金屬的主要方法之一。 在本研究中,我們以磁控濺鍍方式沉積鉭薄膜,在不同的基材上探討RF功率、操作壓力及基材溫度對鉭金屬成相的影響。由本研究中我們發現可藉由改變操作壓力與基材溫度,可以控制α-Ta及β-Ta的成相變化。 此外,我們也進行電鍍銅的研究,在此研究中我們分別探討硫酸、硫酸銅及化學添加劑濃度的變化對銅膜表面晶粒以及結晶相的影響。我們也以電化學方法量測極化效應的大小,探討化學添加劑對銅沉積的抑制行為。由本研究中我們發現銅離子的沉積受到擴散效應的影響遠比極化效應的影響還大。除此,我們也發現到電場強度所產生的極化效應與化學添加劑所造成的極化效應均對銅沉積都會有不同的影響,並且改變化學添加劑之官能基可改變極化效應的大小。

並列摘要


Tantalum (Ta) and copper (Cu) play important roles in future semiconductor metallization processing. Since Ta has high melting point, good chemical resistance and high mechanical stability, it is considered to use as a diffusion barrier in copper metallization. In addition, copper has lower resistivity and high electro-migration resistance than aluminum (Al), therefore it is an alternate metallization material in place of Al. Electrochemical plating has several advantages compared to traditional vacuum deposition due to low cost, low temperature processing and good ability to fill via, it is developed to be major technique for copper deposition. In this study, we use magnetron sputtering to deposit tantalum on SiO2, Si3N4 and Si substrates. According to our study, we could control α-phase and β-phase transformation on tantalum by varying operating pressure and substrate temperature. In addition, a fundamental study in copper electroplating is given on this report. Based on our study, both electrical field and chemical additive could show dramatic impact on polarization effect. Varying chemical group on additive could also change polarization. The degree of polarization effect depends on the nature of chemical additives.

並列關鍵字

copper sputtering electroolating CVS polarization tantalum additives

參考文獻


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被引用紀錄


林俊偉(2005)。微保險絲製造與測試〔碩士論文,淡江大學〕。華藝線上圖書館。https://doi.org/10.6846/TKU.2005.00127

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