This study applied laser ablation method and gas condensation method to produce metallic nanoparticles and then investigated the electrical characteristics of self-assembled nanoparticle films. After applying dynamic light scattering (DLS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) to measure the size distribution of nanoparticles, we discovered that the size of the nanoparticles decreases as the surfactant concentration increases. Furthermore, it varies under different surfactants. This paper utilizes the I - V curve to analyze the half-width V1/2 and the third zero-crossing voltage V3,0 . Moreover, through the process of calculating the number of tunnel junctions N, we proved that the results accord with the simulation method based on references. Nevertheless, the results show that, in the point of disorder junction array, the simulation method still needs some corrections.