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  • 學位論文

建構精簡矛盾矩陣應用於半導體IC封裝測試

Consolidated TRIZ contradiction matrix for IC assembly process

指導教授 : 江瑞清

摘要


「品質是免費的,它不是禮物,但它是免費的。」(Philip B. Crosby,1979)品質與成本並非全然對立的關係,當品質把關做好了,修正錯誤的成本自然降低。因此企業經營若想有效成本控管,「創新改善」是勢在必行的策略之ㄧ,惟有提升了產品品質,方能有效提升產出、降低錯誤修正,進而增加公司競爭力。 有鑒於過去產線多半從經驗中成長,每當面臨新的問題時,往往無法迅速的找到有效的改善對策。本研究提出一「半導體IC封裝測試精實矩陣」,為TRIZ矛盾矩陣之精簡限定版,將39工程參數刪減至9工程參數並精簡為4群組,40發明原則刪減為13發明原則、5群組。初步限縮應用範圍為半導體IC封裝測試之量產流程,期許可以幫助IC封裝測試之量產流程中之問題解決與提出完整的改善對策。 根據2實際案例驗證發現「半導體IC封裝測試精實矩陣」確實可以找出適合之改善對策,並提供更多面向的建議改善方向。

並列摘要


“Quality is free. It’s not a gift, but it is free.” Quality does not opposite to cost. Quality is not a concept which opposites to cost. If quality controls are doing well, cost of mistakes correction would be reduced. Hence, innovation improvement method is one of the must strategy of enterprise who wants to better control quality cost. Improve products quality, reduce abnormality correction and increase competitiveness directly. In the past, production people learned the experiences from mistakes. When new problems come, there is no effective tool to help on finding solution. The purpose of this study attempted to construct a consolidated TRIZ contradiction matrix for IC assembly process which expects help production line to quickly response on quality issues with a complete solution. Reduce 39 engineering parameters to 4 engineering groups, 40 inventive principles to 5 inventive principle groups. Based on feasibility verification result of 2 actual cases, the consolidated TRIZ contradiction matrix for IC assembly process do help not only on solution providing, but also creating more improvement directions.

參考文獻


王靜怡,2014,”從整合8D與TRIZ探討系統化品質改善流程-以硬碟製造為例”,國立交通大學工學院工程技術與管理學程,碩士論文。
邱富寬,2014,”建構精實價值矩陣應用於流程改善之研究”,中原大學工業與系統工程研究所,碩士論文。
郭宇智,2008,”應用萃思工具解決封裝元件導線架脫層問題”, 國立清華大學工業工程與工程管理所,在職專班碩士論文。
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Retseptor G., 2007, “40 Inventive Principles in Customer Satisfaction Enhancement”, The TRIZ Journal (http://www.triz-journal.com).

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