- 學位論文
射出壓縮成型製程參數對DVD基座性質 特性影響之研究
Effect of Process Parameters of Injection Compression Molding on the Property-Characteristics of DVD Substrates
摘要
本研究射出壓縮成型對DVD光碟片物性探討，隨著光碟片容量愈大，Stamper溝軌密度提高，射出機需大噸數壓模，才能將溝軌成型變好，但對光碟片物性產生極大影響。因此光碟片生產過程，射出成型調整參數會造成光碟基板物性變化，當光碟基板雙折射太高會造成反射率偏低，使光碟片在光碟機讀取中造成訊號干擾。基板翹曲會造成外觀及物性變化，造成光碟機降速而影響光碟讀取，則Stamper的Groove轉寫形狀成型不良影響成品電性變化。射出壓縮調整參數，瞭解各段參數變數影響。 本研究使用光學級聚碳酸酯（帝人 PC AD-5503）為實驗塑料，射出成型條件探討初始合模距離、初始合模時間、壓縮力、壓縮力時間、壓縮力切換時間、保壓、保壓時間，研究中使用物理特性測試機MT-146，觀察射出成型條件對RB、RD、TD、VD、GD特性變化，瞭解成型設定條件對實驗結果。 研究結果顯示，RB在1st初始合模及2nd壓縮力對23mm、40mm內圈位置可調整到±10nm內；RB在3rd及4th壓縮力對55mm、58mm外圈位置可調整到±10nm內。1st初始合模時間愈久對GD成型不良，愈外圈位置GD低於35nm以下，而基板翹曲外圈位置RD -0.6、TD 0.2、VD -150變大，2nd壓縮力進行Stamper面複製工程GD在43nm~45nm內，增加2nd壓縮力基板翹曲RD、TD、VD變正外觀呈洋芋片狀，充填結束保壓開始，保壓使碟片較密實，但材料過度被擠壓，產生較強內應力。3rd壓縮力設低檔主要釋放內應力，基板翹曲RD -0.4、TD -0.3、VD -100可達到規格內，4th壓縮力設高檔主要把Pit加深使溝軌完全成型。
並列摘要
This research focused on the influence of the injection parameters to the physical properties of DVD disk. In order to increase the storage volume of the disk, it is necessary to raise the groove intensity on the stamper. During the manufacturing process, the parameters of the injection molding machine have a significant effect to the final products. The birefringence may reduces the reflection signal, and interferes the original signal when reading the disk. Warpage also reduces the reading efficiency, because a serious and unexpected vibration forces the reading machine to limit the speed of the disk. Furthermore, the defect of grooves usually results to the electrical problems of the disk. Thus to understand the relationship between these parameters is important. This research uses optical grade Polycarbonate ( Panlite AD-5503 from Teijin Chemicals Ltd. ) to investigate the effect of the injection parameters, including initial molding distance, molding time, molding pressure, holding pressure etc. The data of the RB、RD、TD、VD、GD is measured by the MT-146 to realize the effect of these injection parameters. This study verified that the RB at 23mm and 40mm can be controlled in ±10nm by adjusting the initial mold gap and 2nd molding pressure. On the other hand, the RB at 55mm and 58mm can be controlled in ±10nm by adjusting the 3rd and 4th molding pressure. The longer initial molding time results to the incomplete GD failure, the GD reduces to below 35nm at the outer circle. Meanwhile, the warpage at the outer circle enlarges the RD -0.6, TD 0.2 and VD -150. The 2nd clamp force controls the depth of GD during 43nm to 45nm. When applied a higher 2nd clamp forces, the warpage makes the RD, TD and VD become positive, and a potato chips appearance is obtained. A higher packing pressure condensed the disk and make a better duplication of the grooves, but also induces a stronger internal force in the disk. Thus a low 3rd force is necessary to release the internal force and controls the warpage RD -0.4, TD -0.3, VD -100 in acceptable range. A higher 4th clamp force makes a deeper Pit to get a complete groove pattern.