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  • 學位論文

提昇記憶體模組測試績效之研究 —以P公司之整合式測試平台系統為例—

Research of Memory Module Testing Performance – Using Integrated Testing Platform System of P Company As Example

指導教授 : 林賜德

摘要


我國半導體產業自60年代開始發展,帶動了IC製造的相關產業,使得台灣的記憶體產業在世界上占有了相當重要的地位,而記憶體模組測試則是該產業中較複雜而繁瑣的作業過程,若能在測試作業方面擁有獨立自主之技術能力或適用的測試平台,即可提升生產效率與降低產品成本,並增加接單能力,將有助於提升我國記憶體產業在全球地位上的競爭。本論文緣於上述之動機,以電腦整合製造的理論,探討建構一「整合式測試平台系統」,對於該系統在製造記憶體模組過程中,其測試績效之影響。   研究中首先探討關鍵成功因素與績效評估、再介紹記憶體、記憶體模組製造與測試的資訊,接著探討電腦整合製造(CIM),及建構系統所用的可延展標記語言(XML)與網路服務(Web Service)等相關技術資訊,並完整呈現該系統的整個建構過程。然後以實際個案公司採用實驗設計之研究方式,藉由實驗設計的結果,研究導入「整合式測試平台系統」對該個案公司的記憶體模組測試績效之影響。以透過 1.人為錯誤、 2.測試良率、 3.測試工時等,共三個構面來評估「整合式測試平台系統」,瞭解其是否確實提升了記憶體模組測試的績效。   最後,透過實際個案進行的實驗設計分析後發現,「整合式測試平台系統」在本研究所探討的三個構面中,都能夠有效的影響記憶體模組測試的績效,對於降低「人為錯誤」、提高「測試良率」與縮短「測試工時」等方面都有相當大的助益。而「整合式測試平台系統」的建置成本對個案公司投資金額是相當低廉的,但卻可以達到提昇記憶體模組測試的績效。並進而達成有效強化企業管理的能力且提高企業競爭的能力。

並列摘要


Semiconductor industries development starting from 1960, driving IC manufacturing industries to go, too. Memory industries of Taiwan occupy the position of importance in the world, moreover, memory module testing processing is much more miscellaneous and complicated in the industry, if the autonomy of technology or the fit testing platform can be built in the testing operation, the operation efficiency and the product cost will be reduced and the ability to get order from customer will be promoted, that is, the competitiveness in the memory industries will be upgraded all over the world. Based on the reason as above. The discussion research of the “Integrated Testing Platform” which is constructed by the CIM theory impacts on testing effectiveness of memory module in manufacturing.   The key successful factors and performance evaluation will be discussed in the beginning, then what is the memory and how memory module to make and test which are introduced, then CIM and the technologies containing XML and Web Services which are used to construct the platform will be described and the construction process will be expressed in complete. A case study is adopted as the method of experimental design, by means of the results, the impacts on the client company’s testing performance of memory module by the implementing of “Integrated Testing Platform” will be discussed. Based on the client, three approaches are used to evaluate the “Integrated Testing Platform” if will be benefit to upgrade the testing performance, they are: 1.operational error, 2.testing efficiency and 3.testing yield.   By means of the analysis of the experimental design, we will find out that all of three approaches have significant impacts on the testing performance, containing decreasing the operational error, upgrading testing yield and decreasing the testing time. Besides, the implemental cost of Integrated Testing Platform is not expensive but it is work to upgrade the testing performance. As the result, the testing performance can strengthen the operational management and the competition of the business.

參考文獻


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被引用紀錄


吳佩珊(2011)。應用系統模擬於記憶體測試人力配置問題〔碩士論文,國立虎尾科技大學〕。華藝線上圖書館。https://www.airitilibrary.com/Article/Detail?DocID=U0028-2207201110503700

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