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  • 學位論文

電阻切換特性與陽極氧化鋁奈米孔徑關係之研究

Study of the Correlation between the Resistive Switching Characteristics and Pore Size of Anodic Aluminum Oxide

指導教授 : 黃建華
共同指導教授 : 吳幼麟(You-Lin Wu)

摘要


陽極氧化鋁(Anodic Aluminum Oxide),簡稱AAO,為一種具有規則排列的蜂巢狀多孔洞級材料。其擁有均勻筆直的通道結構,直徑最小可達到奈米等級,以及高介電係數的性質,使其在奈米材料製作的領域以及生物科學、電子、化學等其他領域都有很大的發展。 本論文旨在探討AAO孔徑大小與其電阻切換間之關聯性。我們先在孔徑大小不同的AAO模板上下使用電子束蒸鍍機(E-beam Evaporator)分別鍍上100 nm的二氧化矽(SiO2)後,再使用小型真空蒸鍍機在其中一面蒸鍍底電極鋁(Al),最後在另外一側利用金屬遮罩蒸鍍點狀金屬鋁作為頂電極,形成Al/ SiO2/ AAO/ SiO2/ Al的結構。此處使用上、下層SiO2是為了防止在蒸鍍電極過程中金屬進入AAO孔洞而影響所量測電性的正確性。 我們使用Agilent4156B半導體參數分析儀對AAO元件進行電流-電壓(I-V)特性的量測。我們發現,以AAO為材料主動層之元件具有雙極性之電阻切換特性。對相同電極面積大小的AAO元件,通過元件之電流密度隨著孔徑大小增加而增加,其高阻態電阻(RHRS)及低阻態電阻(RLRS)亦隨著孔徑大小增加而減少。我們將在本論文中探討這些特性的原因。

並列摘要


Anodic aluminum oxide (abbreviated as AAO) is a material that has regular high density array with honeycomb-shape pores. The AAO has high dielectric constants and its pores have diameters in the range of a few to several hundred nanometers, forming straight hollow channels in AAO. These unique properties make AAO find a lot of applications in nanomaterials fabrication, bioscience, electronic and chemistry areas. The main theme of this thesis is to investigate the correlation between the resistive switching characteristics of AAO and its pore size. At first, we deposited a 100nm-thick silicon dioxide (SiO2) layers on top of the AAO template by e-gun evaporation. An aluminum (Al) back gate layer was then deposited on the bottom SiO2 by using a thermal evaporator. Finally, an Al layer was deposited onto the top SiO2 layer through a metal mask, also by thermal evaporation. The completed device has a structure of Al/SiO2/AAO/SiO2/Al. The top and bottom SiO2 layers used here are to prevent possible metal penetration into the hollow pore channels during metallization. Electrical characterization of the AAO devices was carried out by using the Agilent 4156B semiconductor parameter analyzer to measure their current-voltage (I-V) characteristics. It is found that the devices using AAO as active layer exhibit bipolar resistive switching. It is also noticed that, for the AAO devices with the same top electrode area, the current density flowing through the devices increases while the resistance of high-resistance state (RHRS) and resistance of low-resistance state (RLRS) decrease with increasing pore size. We will discuss the root causes of these characteristics in this thesis.

參考文獻


參考文獻
一、中文部分
李思毅、李佳穎、曾俊元,「奈米材料的製程及其潛在的應用」,物理雙月刊(二十六卷三期),中華民國93年06月
張家隆,成功大學微電子工程研究所 碩士論文「以陽極氧化鋁模板製備氧化鎢及金屬鎳奈米線及其場發射特性之研究」,中華民國96年
黃俊元,國立暨南國際大學電機工程學系 碩士論文,「與γ-APTES 分子結構相關之電阻切換」,中華民國108年07月

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