透過您的圖書館登入
IP:3.138.122.195
  • 學位論文

嵌入式系統監測還原模組開發與驗證

Development and Verification of a Log-based Recovery Module in Embedded Systems

指導教授 : 陳永源
若您是本文的作者,可授權文章由華藝線上圖書館中協助推廣。

摘要


隨著科技的發展,嵌入式系統的技術以及應用廣泛帶給人們越來越多的便利性也越貼近我們的生活。但是當嵌入式系統應用在關鍵性安全相關領域上,系統的可用性及可靠度議題就必須被注意,且系統必須有相應的保護技術以降低、避免危害人身財產安全的問題及影響。嵌入式系統當機的主要原因之一:資料汙染錯誤。 本篇文章主要提出一系統監測還原機制來解決嵌入式系統在資料汙染錯誤發生時所造成的影響,維持系統正常的功能。此監測還原機制透過全系統的監測來確保任何應用程式或系統作業程序受到干擾而產生資料汙染錯誤,導致當機時能夠偵測並且透過自動還原方法將系統恢復正常狀態繼續運作。在此機制的驗證方面,我們使用了九個不同的應用程式做為測試及實驗對象,隨機產生資料汙染錯誤來驗證其有效性,實驗結果顯示本文提出之保護機制可大幅提升系統強韌度,並觀察到系統受干擾後之恢復力不僅僅與系統資源使用量有關,系統特性不同也會有所改變。

關鍵字

嵌入式系統 Bad Block 容錯 還原

並列摘要


Embedded systems have been widespread for novel technologies which bring people more convenience and hence become more relevant to our life. When embedded systems are utilized on safety-critical applications, their availability and reliability issues must be addressed and systems must be protected by effective techniques. One primary cause of the embedded system crash is the data corruption error. In this study, the embedded system crashes caused by data corruption errors are resolved by an autonomous recovery software methodology (ARSM). ARSM is composed by system monitor, bad block salvage, autonomous recovery mechanism and OS initial backup. ARSM performs all-operation system monitoring. Once any application software and operation system crash is detected, the autonomous recovery mechanism will be activated to recover the embedded system back to normal operation. For verification of the ARSM, we adopt nine applications to be the case demonstration, and generate data corruption errors to validate the efficiency of the ARSM.

並列關鍵字

Embedded system Bad block Fault-tolerance Recovery

參考文獻


[2]. Albinet, Arnaud, Jean Arlat, and J-C. Fabre. "Characterization of the Impact of Faulty Drivers on the Robustness of the Linux Kernel." In Dependable Systems and Networks, 2004 International Conference on, pp. 867-876. IEEE, 2004.
[3]. Chen, Yung-Yuan, Yang-Lun Kuo, and Kuen-Long Leu. "An autonomous recovery software module for protecting embedded OS and application software." In Global High Tech Congress on Electronics (GHTCE), 2012 IEEE, pp. 165-169. IEEE, 2012.
[4]. Wang, Chundong, and Weng-Fai Wong. "Extending the lifetime of NAND flash memory by salvaging bad blocks." In Proceedings of the Conference on Design, Automation and Test in Europe, pp. 260-263. EDA Consortium, 2012.
[8]. Li, Guodong, and Hu Chen. "A new high-level security portable system based on USB Key with fingerprint." In Computer Design and Applications (ICCDA), 2010 International Conference on, Vol. 1, pp. V1-159. IEEE, 2010.
[9]. Kanoun, Karama, Yves Crouzet, Ali Kalakech, and Ana-Elena Rugina. "Windows and Linux Robustness Benchmarks With Respect to Application Erroneous Behavior." Dependability Benchmarking for Computer Systems 72, pp. 227. 2008.

延伸閱讀