本文運用PID控制法則進行奈米級光學對位與壓印系統設備之系統整合與控制,此設備系統主要分為兩部分,一部分為奈米級光學對位系統,系統包含一組XXY高精度對位平台、一組三自由度(X、Y、θZ)雷射干涉儀迴授系統、一組上下模具CCD標記影像辨識系統,此系統用於壓印平台壓印時,即時監控壓印上下模具間相對位置(X-Y)與角度(θZ)誤差訊號;另一部分為壓印平台,其系統包含Z軸運動機構搭配光學尺訊號,進行Z軸壓印動作,在壓印過程可進行三段速度調整。 系統控制是以PID控制器進行XXY對位平台控制及Z軸馬達控制,控制方法為兩段式控制補償,分別為速度模式進行長行程位移控制,位移速率5mm/s,控制精度分別為X軸2 um、Y軸2 um、θZ軸2 arc-sec、Z軸1 um,在精度達成上述定位精度時,系統自動切換至扭矩模式,進行奈米級定位補償控制,此時系統定位精度分別可達X軸70nm、Y軸50nm、θZ軸0.3 arc-sec。
This research concerns the development of a controller with optical alignment and Z-tilts error compensation for the nano-imprinting equipment. This nano-imprinting equipment comprises two important techniques: optical alignment system and imprinting stage. The optical alignment system which integrates the technologies of the XXY precision alignment stage, the 3-DOF laser interferometer measuring system and the CCD image recognition system of the mold mark allows to instantly compensate for positioning error(X-Y) and yaw error(θz) of dual-molds. The imprinting stage integrates Z-moving stage, 3-DOF Z-tilts compensating Piezo stage and Laser Displacement measuring system. The imprint operation can be completed with Z-moving stage and used linear scale to control position of Z-axis. The hybrid PID control with speed mode and torque mode is used to control the motion of the XXY precision alignment stage and the Z-moving stage. The speed mode control for long strobe position has been accomplished at constant speed of 5mm/s, the each position accuracy along the X- axis, Y- axis and Z- axis is 1um and the angular error along θz-axis is 1 arc-sec. The accuracy can be improved by using the torque mode control. The each result of the position accuracy along the X-axis, Y-axis and Z-axis is 50nm and the angular error along θz-axis is 0.5 arc-sec.