具比對與量測功能之影像測量系統設計研發

傳統式之光學投影機為一耳熟能詳之品管檢驗設備且已經延用數十年，由於高科技產業之發展光學投影機已經不能滿足精度與速度之需求而發展出經CCD取像之影像測量儀，而市售之影像測量儀又無比對之功能而無法完全取光學投影機。本文之研究是以提昇影像量測系統之比對與量測功能，使其能完全取代光學投影機之比對與量測兩主要功能為主，並將光學投影機倍率變換之不方便性與表面不易量測之缺點，提供有效解決方法及增加報表統計分析功能，將量測時產生之數據可以做統計分析並直接產生報表，完成優於光學投影機之影像量測系統之設計開發。

關鍵字

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並列摘要

The traditional optical profile projector is the familiar inspection equipment for many years.Because the profile projector can not satisfy the request of high accuracy and high speed for the high-technology industry., the image measuring system was studied by using the Charge Coupled Divice(CCD) to capture the image of patterns , instead of the profile projector. But the image measuring system in the market does not have the matching function, so it can not replace the optical profile projector completely. To develop the matching and measuring functions instead of optical profile projector is the major purposes of this research. It could offer the effective solution to solve the inconvenience of changing lens and the difficulty of measuring the surface of working piece by the profile projector. The image measuring system has been promored to have increase the function of statistics analysis and can make SPC report directly. The better design on the image measuring system.has been finised.