發光二極體高加速應力壽命實驗 規劃與壽命預估模式

High Accelerate Life Test Plan and Life Prediction Model for Light Emitting Diode package

蔡裕豊(Yu-Fen Tsai)

指導教授 ： 陳文瑞君

國立虎尾科技大學/電機資訊學院/光電與材料科技研究所在職專班/碩士(2011年)

摘要

本文主要利用統計學概念對背光模組用LED的壽命進行估算， LED在運用上對於壽命的要求越來越高，係利用可靠度與高加速倍數模式等相關手法進行分析，探討出有效獲得LED真實壽命的模式且達到背光模組的要求。
首先執行界限實驗，確認產品能力範圍，利用其結果定義出壽命實驗的條件。利用高於一般應用的條件來加速LED的光衰，得到的數據使用指數分佈計算出光衰達到50%的樣品壽命(L50)再利用最大概數法與韋伯分析等統計學函數，估算出各組實驗的群體壽命(L50B50)，實驗所得的群體壽命分別代入Arrhenius model、Inverse Power Law與Hallberg-Peck加速倍數模式，如此就可以得到真實的群體壽命。最後用線性回歸方程式來確認各組實驗的有效性。

關鍵字

LED ； 背光模組 ； 群體壽命 ； 韋伯分佈 ； 加速實驗

並列摘要

This study used the statistics construct to estimate the LED backlight model lifetime. For LED backlight model, the lifetime request is higher and higher, consequently we make use of the reliability and HALT model to analyze and obtain the actual lifetime of LED backlight model.
At first we execute the upper function limits(UFL) experiment to confirm the scope of product capability and use UFL’s results to define the HALT condition. we use the highly operated conditions to accelerate the LED’s lumen decay and use the Exponential distribution to obtain the lumen decay achieve to 50% data, further the value of body life were obtained by the Maximum Likelihood (MLE) and Weibull distribution. According to the above results, we can use accelerated model to calculate the accelerated multiple and obtain the actual lifetime. Finally we use the Linear regression equation to verify the L50B50 value, when the R2 value is greater than 90 percentage, the experiment results are effective value.

並列關鍵字

LED ； backlight ； body life ； Weibull distribution ； HAL

參考文獻

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