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  • 學位論文

單刀雙擲功能的射頻切換器測試系統架構設計

Structural Design of the Testing System for the Single-Pole Double-Throw RF Switch

指導教授 : 陳文瑞
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摘要


本文係為單刀雙擲SPDT (Single Pole Double Throw)的射頻切換器產品去開發模組化測試系統,以安捷倫84000自動化測試設備ATE (automatic test equipment)架構為基礎,以及相關網路分析儀透過GPIB (General Purpose Interface Bus)介面為平台進行儀器之間整合,因應產品之測試需求,評估以NI (National Instruments)模組化卡片去進行整合,以實際運作時只需幾個主要單元就可滿足測試需求,將所需單元進行組裝及測試驗證,試圖減少測試機成本及空間成本,減少不必要之資源浪費以及提升測試速度。透過軟硬體搭配及優化分析後,依據量測結果,針對影響測試誤宰(overkill)率最高的參數(亦即插入損失insertion loss)做分析改善,最後以系統重複性校正(calibration)的方式,針對傳輸訊號及時間進行監控以降低漂移誤差(drift error)的幅度,並訂定插入損失IL(Insertion Loss)0.3dB為自動校正系統標準GS(Golden Sample)的中心值使降低誤宰現象之產生,使產品有更高之信賴度。

並列摘要


In this paper, the modular testing systems was developed to test the single pole and double throw (SPDT) radio frequency (RF) switch. The conceptual basis was the Agilent 84000 automatic test equipment architecture and the network analyzer. Then, they are integrated together through the GPIB interface. For the requirement of the product, the NI modular cards were evaluated to use as the integration. According to the testing specifications of the specific product, only some principle units were needed in actual work. So we can just select the units which we would like to assemble and run a testing verification. Therefore, the tester cost and space cost were thus being reduced. The target here is to reduce the unnecessary waste of resources and increase testing speed. To combine the software and match the hardware, the optimization analysis was performed. According to the measurement results, the highest impact parameter was the insertion loss. The insertion loss usually causes the testing fail that is overkill phenomenon, so it should be analyzed and improved. Finally, the transmitted signal and time variable were monitored to provide a repeat calibration, and the level of the drift error can thus be reduced. The center value of insertion loss was defined as 0.3dB which is used as our automatic calibration system standard value. The fail ratio of overkill can be well controlled and the product reliability can be promoted.

並列關鍵字

RF switch insertion loss

參考文獻


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