光學應變規之量測特性

The Measurement Characteristics of Optical Strain Gage

謝宏榮(Hung-Jung Shei) ； 曾柏崴(Bor-Uei Zeng)

《中華技術學院學報》 36期 (2007/06) Pp. 17-29

https://doi.org/10.7095/JCIT.200706.0017

摘要

本實驗主要是以單狹縫繞射理論配合雷射架構與影像擷取系統結合，形成光學應變規量測系統，建立一套較精準之量測方法。其儀器操作與架設儀器都很容易，跟一般量測亮紋之量具做比較也可求得更精準之數據，因影像感測系統量測範圍最小尺寸可達10微米，且所擷取之影像亦比肉眼觀察的更清晰、更準確，所以誤差範圍也相對的縮小。

關鍵字

單狹縫 ； 繞射 ； 光學應變規

並列摘要

The topic of this experiment is to apply both laser and digital image capturing system to construct a precise measurement system named optical strain gauge. Comparing to a traditional ruler to fetch the distance between the fringes within the theory of single slit, the optical strain gauge can do much more precisely based on the resolution of CCD sensor. This system optimistically will replace the measurement from naked eyed、traditional ruler and the achieved dimensions become more clearly, precisely and narrower tolerance.

並列關鍵字

Single slit ； diffraction ； Optical Strain Gauge