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並列摘要


A SQUID probe microscope has been developed. A super sharp needle which was polished to be submicron chip-top by electrochemically and micron-size toner particles of laser printed letters were observed clearly by this SQUID probe microscope. Sample vibration technique improved S/N ratio. Data defects in two dimensional observation occurred by noise, flux trapping and line drift. These were removed by the image processing to get clear images.

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被引用紀錄


Chiu, W. C. (2011). Subwavelength Silicon-Wire Photonics [doctoral dissertation, National Tsing Hua University]. Airiti Library. https://doi.org/10.6843/NTHU.2011.00642

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