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以石英奈米錐狀陣列作為具抗反射性質之次波長結構

Fabrication of Nanocone Subwavelength Antireflection Structures on Quartz Substrates

摘要


本研究結合自組裝奈米球微影(self-assembled nanosphere lithography, SANL)及感應耦合電漿離子蝕刻(inductively coupled plasma reactive ion etching, ICP-RIE)兩項技術,製作出具規模排列之錐狀陣列結構,可應用於光學系統之抗反射層。我們發展一種簡單的製程,成功地在石英玻璃基板上製作出次波長結構,期望能達到寬頻抗反射的效果,以增加入射光對石英玻璃的穿透率。實驗結果證實利用薄光阻格狀結構搭配震盪塗佈法,可以在石英玻璃上製備一單層且整齊排列之聚苯乙烯奈米球,並以此為遮罩進行乾式蝕刻。在乾式蝕刻方面,我們利用C4F8/He電漿對石英玻璃進行蝕刻,以聚苯乙烯奈米球為遮罩所得到的結構為一圓柱狀,藉由調整蝕刻製程參數,則可得到尖錐狀結構。實驗結果顯示最佳的次波長抗反射結構為高度190 nm、直徑108 nm、深寬比可達1.81:1之錐狀陣列,並使得波長300-1000 nm的入射光之有效反射率下降到6.75%,達到寬頻抗反射的效果。

關鍵字

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並列摘要


This study combined self-assembled nanosphere lithography (SANL) and inductively coupled plasma reactive ion etching (ICP-RIE) for fabricating orderly arranged nanocone arrays on a quartz substrate. We established a simple process for successfully fabricating subwavelength structure (SWS) on glass substrate, achieving broadband anti-reflection (AR) and increasing the transmittance of incident light across the quartz glass. This novel process arranged a monolayer of nanospheres onto 2 x 2 cm^2 test specimen. In addition, we evaluated various etching times of ICP-RIE for producing SWS surfaces, which resulted in various specific surface areas for the quartz surfaces. Smoothly tapered SWS surfaces with a width of 108 nm and a height of 190 nm could be produced on quartz wafer. This fabricated SWS decreased the surface reflectance less than 6.75% in the visible light spectrum.

並列關鍵字

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