X光同調繞射顯微術之簡介與發展

Introduction to X-Ray Coherent Diffraction Imaging

陳健群(Chien-Chun Chen) ； 陳寧容(Ning-Jung Chen) ； 楊智衡(Jhih-Heng Yang)

《科儀新知》 214期 (2018/03) Pp. 59-66

摘要

同調光繞射顯微術為近年來台灣光子源重點發展的影像技術之一。此技術的優美之處在於實驗裝置簡單，毋須透鏡即能成像，避免了像差所衍生的複雜修正問題，因此受到科學界的重視，並廣泛應用於生物、軟物質、材料檢測等方面。結合斷層掃描的技術更能進行三維高解析度非破壞性的檢測工作。本文將介紹同調光繞射顯微術的發展緣起與進程，各式不同的實驗設計，以及此技術所面對的挑戰與瓶頸。

並列摘要

Coherent diffraction imaging is currently one of the major image techniques in Taiwan Photon Source. The beauty of the experimental setup is so simple that no lenses are needed to form an image. This lensless imaging technique bypasses the sophisticated aberration-correction process; hence it has been widely applied to image biological structures, soft matters, and micro-/nano-materials. In addition, a high-resolution non-destructive 3D structural determination can be performed through the combination of computed tomography. In this article, the history, developments, and various experimental setups of coherent diffraction imaging will be introduced. The bottleneck and future challenges are also discussed.