TFT-LCD組裝段生產系統檢驗選擇策略

Inspection Selection Strategy in TFT-LCD Cell Production Systems

饒忻(Hsin Rau) ； 卓國華(Kuo-Hua Cho) ； 余奕霆(Yi-Ting Yu)

《品質學報》 19卷6期 (2012/12) Pp. 565-580

https://doi.org/10.6220/joq.2012.19(6).03

摘要

在生產系統中，對於在製品之檢驗儼然已成為確保品質的基本程序；但由於企業所提供之檢驗資源有限，故如何妥善運用有限的資源至適當位置進行檢測，勢必為企業當前所需面臨的考驗。因此，藉由設置檢驗站來控制品質、降低生產不良率與維持較為優勢的生產成本，便成為一個重要的議題。本研究針對面板組裝段非序列生產系統建構多品質特性檢驗選擇之模式，以總利潤為目標函數，並決定檢驗站的設置及品質特性的最佳檢驗策略。除利用窮舉法外，並利用基因演算法求解，不僅得到最佳解外，其執行時間也少了許多。本研究成果可作為相關產業生產系統檢驗策略擬定時的參考。

關鍵字

多品質特性 ； 非序列生產系統 ； 檢驗選擇策略 ； 薄膜電晶體液晶顯示器

並列摘要

The inspection process in production systems has become an essential and basic procedure to ensure product quality. Due to limited inspection resources, how to allocate inspections effectively is a challenging task for maintaining quality, reducing the number of defective products, and keeping a lower production cost. This research develops a mathematical model for the production system of TFT-LCD (Thin Film Transistor Liquid Crystal Display) cell which is a non-serial production system with multi-characteristics. We will use expected total profit as the objective function of the model for determining the optimal inspection allocation. Besides using the complete enumeration method, this study also uses a genetic algorithm to solve the model. The genetic algorithm method can not only obtain the optimal solution, but also have much less execution time. We believe that the results of this study can serve as a reference to the related industries for making decisions on allocating inspections for their production systems.

並列關鍵字

multi-characteristics ； non-serial production system ； inspection selection strategy ； TFT-LCD (Thin Film Transistor Liquid Crystal Display)

參考文獻

Britney, R. R., 1972, Optimal screening plans for nonserial production systems, Management Science, 18(9), 550-559.

Chakravarty, A. K. and Shtub, A., 1987, Strategic allocation of inspection effort in a serial, multi-product production system, IIE Transactions, 19(1), 13-22.

Garcia-Diaz, A., Foster, J. W., and Bonyuet, M., 1984, Dynamic programming analysis of special multi-stage inspection systems, IIE Transactions, 16(2), 115-126.

Goldberg, D. E., 1989, Genetic Algorithms in Search, Optimization, and Machine Learning, Addision-Wesley, Reading, MA.

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