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高介電常數材料金氧半元件之發展

High Permittivity Gate Dielectric Materials for CMOS Technology

摘要


近年來有關高介電常數閘極介電材料的研究與發展越來越受到重視,有很多新穎的高介電材料被提出。本文簡單地從物理和化學角度出發,整理高介電材料的發展方向,包含高介電材料本身的特性與組成、介面層的性質與控制、以及如何選擇高介電材料。此外,本文並整理與分析高介電材料所面臨的問題。

並列摘要


In recent years, researches on high-K gate dielectrics attract more and more attention. A variety of new high-K materials have been proposed. From the physical and chemical points of view, this article reviews the development of high-K gate dielectrics, including the essential characteristics and compositions of high-K materials, as well as the interfacial engineering. The problems associated with the high-K gate dielectrics are also discussed in this article.l

並列關鍵字

High-K materials Interface

被引用紀錄


楊東昇(2016)。溶膠凝膠法製備氧化鉿與氧化鉭混合膜的特性探討〔碩士論文,中原大學〕。華藝線上圖書館。https://doi.org/10.6840/cycu201600753

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