導入RFID與Barcode系統於半導體晶圓廠倉儲管理流程改善之研究

Installing RFID and Barcode Systems for Improving the Warehouse Management Process in Semiconductor Wafer Fab

徐承毅(Chen-Yi Hsu) ； 郭晉源(Jun-Yuan Kuo) ； 陳彥良(Yen-Liang Chen)

《運籌與管理學刊》 7卷2期 (2008/12) Pp. 49-59

https://doi.org/10.7047/JLM.200812.0049

摘要

半導體晶圓廠爲我國兩兆雙星之產業，倉儲作業流程管理好壞將影響半導體晶圓廠倉儲管理之績效，進而影響公司交貨時間及物流及人力成本，因此倉儲管理流程之改善有其研究之重要性。本論文之研究方法主要是運用多評準決策層級分析法，分析出倉儲管理在進行流程改善時應考量之構面及影響因素，並運用灰色關聯分析法來探討與評估倉儲管理導入Barcode與RFID與評估渴望值之間的關聯程度，作爲個案公司倉儲如何改善方可達渴望值之參考依據。

關鍵字

無線射頻身分識別 ； 二維條碼 ； 多評準決策 ； 層級分析法 ； 灰關聯分析法

並列摘要

Semiconductor Wafer Fab is one of the Two-Trillion Twin-Star Industries Development Plan. The performance of the Warehouse management process shall affect the effectiveness of the Warehouse management of the semiconductor wafer Fab, thereby affecting the product delivery time, logistic and cost of manpower of the company. Hence, it is critical to investigate ways to improve the Warehouse management process. This dissertation primarily adopts an investigation method that utilizes Multiple Criteria Dicsion Making (MCDM) Analytic Hierarchy Process (AHP) to derive the aspects and affecting factors to be considered when improving the Warehouse management process. Furthermore, the Grey Relational Analysis is used to investigate the relativity between evaluation of the Warehouse management with Barcode and RFID and the evaluated aspired value, thereby forming a reference basis for the warehouse department of a case company to follow in order achieve the aspired value.

並列關鍵字

Radio Frequency Identification ； 2D Barcode ； Multiple Criteria Dicsion Making MCDM ； Analytic Hierarchy Process analysis AHP ； Grey Relational Analysis

參考文獻

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