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模糊失效模式與效應分析於IC Burn In測試工程風險分析

Fuzzy Failure Mode and Effects Analysis in Risk Analysis of IC Burn in Testing Engineering

摘要


本文將模糊邏輯之觀念引入失效模式與效應分析中,並藉由IC的測試Burn-In流程中,介入製程中所有機台模組及各個加工作業步驟,透過部門人員的合作,評估並分析所有製程中之風險因子。因此,模糊自動化對FFMEA整個製程而言有其便利性與必要性,再藉由電腦網路,FFMEA之資料庫將連結至各部門,提供相關性且重要性之資訊。

並列摘要


In this study, fuzzy logic FMEA is introduced to semiconductor assembly and testing industry. By analyzing the machine module and the manufacture procedure and making all departments cooperate with each other, all failure modes can be found. Therefore, automated FMEA for whole process has its convenience and importance. In addition, each department will be connected to the database of FMEA via the computer network to provide relativity and importance information.

參考文獻


C.E. Pelaez、J.B. Bowles()。
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Gilbert L. Barbour()。
Ishikawa,A 、 Amagasa, M.、 Shiga,T.、 Tomizawa. G.、 Tatsuta, R、Mieno.H.(1993)。The Max-Min Delphi Method and Fuzzy Delphi Method Via Fuzzy Integration。Fuzzy Set and Systems。55
Warren Gilchrist(1993)。Modelling Failure Modes and Effects Analysis。International Journal of Quality & Reliability Management。30(5),16-23。

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