以失效模式與效應分析爲基的製程問題分析模式－以奈米碳管背光模組爲例

An Analytical Model for an FMEA-Based Manufacturing Process Problem Applied to a Carbon Nano-tube Back-Light Unit

邱創鈞(Chuang-Chun Chiou) ； 方勇盛(Yung-Sheng Fang) ； 蔡禎騰(Jenteng Tsai)

《科學與工程技術期刊》 5卷4期 (2009/12) Pp. 1-19

https://doi.org/10.7117/JSET.200912.0001

摘要

背光模組製造爲平面顯示器產業中重要的上游產業，研發人員需積極開發新的製程以提高產品的品質與效能。而奈米碳管背光模組(carbon nano-tube back light unit, CNT-BLU)爲可取代現行背光模組之最具潛力的製程。然而，CNT-BLU製程仍處於研發階段，有許多製程問題須加以克服。一般工程師在面對製程問題時僅能依照自身主觀經驗判斷問題的主要原因，缺乏一套系統性分析機制，通常在試誤過程中浪費寶貴的研發時間與成本。因此本研究乃以失效模式與效應分析理論爲基本架構，提出一套結合故障樹分析、特性要因圖、模糊德菲法、模糊推論等方法的製程問題分析模式。並將此系統性分析模式導入CNT-BLU製程問題，進行實際案例驗證。結果發現本分析模式所得到之結果與實際驗證之原因相吻合。如此顯示本研究模式之適用性，亦即本分析模式可作爲CNT-BLU製程問題分析的有效工具，此外本模式並可供相關人員訓練之參考。

關鍵字

失效模式與效應分析 ； 故障樹 ； 特性要因圖 ； 模糊德菲法 ； 奈米碳管背光模組

並列摘要

The back-light unit is one of the most important upstream sectors in the TFT-LCD (think-film transistor liquid-crystal display) industry. The Carbon Nano-tube Back-Light Unit (CNT-BLU) is a highly potential product which uses a CNT back-light source to replace the current back-light unit for display products. Presently, CNT-BLU development is encountering various process problems, detected by engineers on the basis of personal experience. Due to trial-and-error, determining the causes of these various problems usually requires considerable time and cost in the R&D stage. In this report, a modified CNT-BLU Manufacturing Process Problem Analysis Model based on Failure Mode and Effect Analysis (FMEA), in combination with Fault Tree Analysis (FTA), a Cause and Effect Diagram, a Fuzzy Delphi and Fuzzy Inference, is presented. After a real-world case comparison, the results obtained from the proposed FMEA model are promising, showing the capability of process problem analysis. Moreover, this model can provide a useful training tool for engineers to analyze CNT-BLU manufacturing process problems.

並列關鍵字

failure mode and effect analysis FMEA ； fault tree analysis FTA ； cause and effect diagram ； fuzzy delphi ； carbon nano-tube back light unit CNT-BLU