加速檢測大尺寸面板流程分析

The Research of Large LCD Defect Detect with Accelerating Flow Pattern

張旭銘(Shiuh-Ming Chang)

《機械技師學刊》 1卷4期 (2008/12) Pp. 40-43

https://doi.org/10.6208/JPME-2008-04-07

摘要

本文係為一種因應大尺寸面板加速檢測流程之裝置之研究，主要係由面板檢測裝置、輸送帶所組成，其中，該面板檢測裝置係裝設於輸送帶之輸送路徑上，該輸送帶之路徑係呈一U字形，當面板進入輸送帶時，其沿著輸送帶路徑通過第一組面板檢測裝置，並由第一組面板檢測裝置檢測面板之一邊，之後面板於輸送帶上進行轉向並繼續沿著路徑前進，之後通過第二組面板檢測裝置，並由第二組面板檢測裝置檢測面板之另一邊，使面板於輸送帶上能於輸送中完成轉向與檢測而不至阻滯。

關鍵字

大尺寸面板 ； U字形 ； 輸送帶 ； 面板檢測

並列摘要

This research is to scan the defect of large LCD panel and accelerate the flow pattern. The flow patterns like U、V、T、I shapes can accelerate large LCD panel scan velocity. Therefore this conveyer belt using U shape, panels entering the conveyer belt step by step, it can avoid waiting time while defects detect on measure device route. Panel scan one side then changes direction and continued forward along the route on the conveyer belt, measure the other side of panel. The other group of panels can scan continuously one by one and transport to the other segment on conveyer belt.

並列關鍵字

LCD ； U、V、T、I shapes ； conveyer ； defects detect