We report Spin-dependent transport properties and I-V hysteresis characteristics in AlOx magnetic tunnel junctions prepared with different oxidation condition. The bipolar resistive switching and electrically programmable tunneling magnetoresistance measured at high resistance state and low resistance state demonstrate four resistant states in a single device. The fitting analysis of I-V and R-T curves proves that higher-order inelastic hopping, in addition to the tunneling conductivity, within the AlOx barrier contributes significantly to the conductivity of the sample. Our study reveals the possibility of controlling multiple resistance states in an AlOx magnetic tunnel junction using both magnetic field and electric stimuli, which could provide potential application for the multibit memory.