產品壽命最適化試驗條件之實證研究－以液晶顯示器模組為例

The Evaluation of Optimal Condition of Product Life －A Case Study of LCD Module

田治宇(Chih-Yu Tien)

指導教授 ： 王明展

國立臺北科技大學/管理學院/工業工程與管理系EMBA班/碩士(2011年)

https://doi.org/10.6841/NTUT.2011.00148

摘要

近年來不斷有新的顯示器技術被開發出來，而其中以具有輕、薄、體積小及低耗能等優點的液晶顯示器最受歡迎，目前已被廣泛的應用於日常生活用的電子商品上，如手機螢幕、數位相機及GPS等，促使身為人機介面應用中最重要的關鍵零組件－液晶顯示器的產品品質相對地要求提高，當產品在研發階段時，可靠度即成為影響產品品質的關鍵因素，而且關係著產品是否能順利生產及推出。
以產品使用而言，產品各項功能會隨著使用時間的延長，出現功能性衰減的現象。在實務上對於產品失效時間之預測，是以實際產品進行實測，然而實務測試耗時、耗費與耗力，又企業急於交貨或將產品上市，此種長時間的壽命測試實不可行。業者最常見取而代之的作法為進行產品加速壽命實驗。希望藉由加速壽命測試，對產品功能衰減進行失效時間之預測，找出產品壽命最適化試驗之條，產生最佳化產品之可靠度，提出高可靠度需求的產品，以提供市場需求，進而達
到客戶滿意。
本研究是對於產品可靠度，進行產品失效與影響因子的關係確認，進行產品最佳可靠度預估，並期望找出一最適化產品壽命測試之條件，以準確預估產品壽命與品質關聯性，再以加速試驗測試及田口分析方法探討面板製程設計與品質關係，實驗方法分為四個階段：第一階段為「田口方法」；第二階段為「加速壽命試驗」；第三階段為「製程條件最佳化」；第四階段則為「可靠度預估」。實際以液晶顯示器產品進行實證研究，針對液晶顯示器最常發生異常的現象進行初步原因分析，找出影響產品可靠度可能因子，利用田口方法，進行再現性實驗以找出產品壽命最適化試驗條件，並推估產品於正常使用下的平均壽命與失效分佈，藉以改善產品設計瑕疵及製程條件未最適化的問題，並避免長時間錯誤嘗試試驗，進而提升產品壽命及品質，俾利於縮短產品開發時間及提高獲利能力，使企業競爭力更強化。

關鍵字

液晶顯示器 ； 可靠度理論 ； 加速測試方法 ； 田口方法 ； MTBF

並列摘要

The new LCD technology is developing constantly in recent years, especially with the advantage of light, thin, small size and low energy consumption is most popular. Now it is applied in electronic product extensively in daily lives, such as the screen of mobile, digital camera, GPS, and so on. Because of widespread use, as the most important key components for the application of Human-Computer Interface-LCD, the quality of product required for enhance relatively. When the product is in developed stage, reliability will be the key point to affect the quality of product and also related to whether it can be manufactured and published smoothly or not.
As time goes by, every use of goods will appear functional declined phenomenon. At handling practical business affairs, as to the prediction for product failure time, it is measured by practical product, however, the experiment will cost time, money, and effort. If the industry urges to deliver or publish goods, it doesn’t work to do long-time life test. So the industry will do aging test to instead of it. The industry will proceed aging test to predict failure time for functional decline, find out the most suitable condition for product's life, produce the reliability of optimum product and offer high reliable product so the demands of market can be fulfilled and made customer satisfied further.
The purpose of this study is to confirm the relation between product failure and possible factor for product reliability. In order to predict the connection between product life and quality, it is expected to find out the most suitable condition of product life; and further, it is worth to conferred on the relation with the design of LCD process and quality by using aging test and TAGUCHI method. The experimental method is divided to four stages: the First Stage is "TAGUCHI Method"; the Second stage is "Aging Test"; the Third Stage is "The optimum process condition"; the Fourth Stage is "Prediction of Reliability". It will be proceeded practical research and preliminary analysis of abnormal phenomenon that occurred easily on LCD to find out possible factor may affect reliability. In order to avoid wrong trial and promote the product life and quality further, the industry do reappeared test and discover optimum condition of product life by using TAGUCHI method and to speculate the average live and failure distribution in normal use so it might be improved the problem for the defect of product design and process condition without optimum so it can shorten the developing time and increase profit-making ability and enhance industrial competition.

並列關鍵字

Liquid Crystal Display ； Reliability ； Accelerate Test ； Taguchi Method ； MTBF

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