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  • 學位論文

應用量測系統分析於液晶電視製程量測之改善

The Application of Measurement System Analysis Methods for LCD TV Measurement Process Improvement

指導教授 : 丁慶榮
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摘要


摘 要 薄膜電晶體液晶電視是屬於液晶顯示器產業中較高階與深具發展潛力之產業,但也容易因為硬體調整或調整之誤差導致規格邊緣值之不良品出貨至客戶端或者將規格內之良品退回供應商,致使面板供應商與系統組裝廠雙方均需要承擔高額之品質成本。 量測系統分析(Measurement System Analysis, MSA)為戴姆勒克萊斯勒、福特汽車、通用汽車沿用許多學者之共同研究成果所發展出來的一套適用於汽車業的量測系統改善方法。經過多年來的修訂,已經是各行各業改善製程中量測系統的一個代表性的準則與方法,而這本工具書亦於2002年05月進行第三版的變更,而使的此本工具書的內容更臻完善與正確;而本論文之目的除了說明新版量測系統分析之主要架構外,並以實例應用之方式,比較與衡量量測系統重複性與再現性之各種計算方式,並以某知名企業之液晶電視生產線所使用之製程光學量測系統改善實例來做為驗證之依據,結果顯示在導入此一品質工具後亮度之量測重複性與再現性整體變異明顯降低60.41%使其能夠符合量測系統之要求。

並列摘要


ABSTRACT TFT-LCD TV is high level and deeply potentiality development merchandise on FDP industry. Some of the brightness or central chromaticity characteristics could easily beyond threshold value and can not be screened out or rejected within a specification panel at factory quality assurance station. It happens sometimes that a manufacturer ships products beyond customer’s specification to customer site or returns LCD panel to LCD vendor because of bad quality. Extra quality cost might be incurred on both actions to all stakeholders in the supply chain. Measurement System Analysis (MSA) was developed by Daimler Chrysler, Ford Motor and General Motors Corporation. This reference manual has been used in automotive industry to improve the quality measurement. In the high tech industries, such an approach is also used to improve the process measurement. Gage R&R is a measurement approach to measure the repeatability and reproducibility for appraisers and instruments. This research mainly discusses the measurement system structures and conduct different kinds of measurement methods of Gage R&R on an LCD TV manufacturer. The white balance coordinates are measure at the factory to assure the product quality. Based on the collected data, ANOVA of Gage R&R can reduce the gage repeatability and reproducibility. The result shows that the LCD TV optics measurement stations could obviously reduce 60.41% variation by the Gage R&R.

參考文獻


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