以多語意編碼之交錯運行長度測試資料壓縮法

Test Data Compression Based on Multi-Meaning Codeword For Alternating Run-Length Codes

劉定芳(Ting-Fang Liu)

指導教授 ： 曾王道

元智大學/資訊學院/資訊工程學系/碩士(2011年)

https://doi.org/10.6838/YZU.2011.00209

摘要

為了要節省測試資料和測試時間，壓縮測試資料是一個常見且有效率的方法。本論文是以Alternating Run-Length data compression method (交錯運行長度資料壓縮法)為架構，發展出新的壓縮方法以提升資料壓縮率。此壓縮方法主要是利用多一個位元表示的方法讓一組編碼(codeword)能有雙重的語意，讓相同的編碼來表示兩種不同長度的測試資料，進而達成資料壓縮率的提升。最後的實驗結果是以ISCAS’89學術電路測試資料進行測試，而實驗結果也得到提升。

關鍵字

測試資料壓縮 ； 超大型積體電路測試 ； 運行長度測試資料壓縮法

並列摘要

Due to reduce the test data volumn , test data compression is a common and efficent method. This paper is based on Alternating Run-Length data compression method as the framework to develop a new data compression method to improve the compression ratio. The method take the Alternating Run-Length data compression advenntage to improve the test data compression ratio. And our proposed method just use some bits to represent another Run-Length codeword. In other words, our codeword have Multi-Meaning to encode. this method can achieve significant compression ratio. Experimental results for the large ISCAS’89 benchmark circuits have demonstrated the proposed approach can improve the test data compression ratio.

並列關鍵字

Test Data Compression ； Run-Length ； Soc Test Volume ； VLSI Testing

參考文獻

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