RFID於晶圓測試即時共通資訊系統之應用

The RFID Application for Real Time Information Sharing System in Semiconductor Wafer Testing Fab

黃振芳(Huang, C.F.)

指導教授 ： 林則孟

國立清華大學/科技管理學院/高階主管經營管理碩士在職專班/碩士(2010年)

摘要

半導體產業一直是我國產業發展重點之一，但近年來由於許多國家積極進行半導體產業投資，對我國半導體產業的發展衝擊相當大，也面臨了強大的競爭壓力。而屬於半導體後段製程的我國晶圓封裝測試業，雖然亦佔有舉足輕重的地位，如何在晶圓封裝測試代工服務上，提供客戶即時最有效的資訊，讓客戶能在最短的時間內，作出最好的決策，則成為贏得商機、佔有市場的最佳利器。而在客戶獲利與客戶業績興隆的情況下，與客戶的關係將不再只是純粹代工服務的關係，而將轉變為策略夥伴，與客戶共創雙贏的未來。
本個案公司以導入RFID來建立的「晶圓測試即時共通資訊系統」，係由三大管理模組組成，分別為攸關供應鏈的物流資訊管理、掌握庫位資料的精準庫位管理、以及涵蓋測試作業資料的晶圓測試資訊管理，範圍從晶圓製造、晶圓測試到晶圓封裝，將半導體產業鏈各端點自IC設計、晶圓代工、晶圓測試至晶圓封裝串接起來，達到上中下游客戶間的資訊分享即時性。而RFID技術將主要應用於進出貨碼頭、測試機台、氮氣櫃及手推車等工作環境，以晶圓盒與探針卡為追蹤物件，提供自動化進出貨管理、自動化測試流程、與自動化庫存管理等功能，以達到自動化與即時性的管理需求。
本研究驗證晶圓測試廠導入RFID於實際生產環境應用的可行性，透過『RFID技術』與『資訊系統』的整合，降低作業時間、提高生產效率，精確掌握物品流向、改善作業流程、精進製程自動化與監控分析、提供完整的晶圓測試管理資訊。藉由此資訊應用系統，能讓公司經營階層能夠更快速的因應外來的經營挑戰與方向，做更即時之反應與監控，並可以使客戶、上下游外包廠商之間的資訊傳遞更為即時與透明，改善供應鏈間晶圓供料不穩、客戶需求變動頻繁、急單插單需求，及資訊不對等等問題，以期達到晶圓測試生產製造週期之縮短、成本之降低，進而提升產業的競爭力。

關鍵字

晶圓 ； 探針卡 ； RFID ； 庫位管理 ； 物流資訊 ； 晶圓測試資訊 ； 即時共通

並列摘要

Semiconductor industries are always the major economic development and focus of Taiwan which have greatly influence the progress and implementation of electronics around the world and have deeply impacted and advanced on everyday lives. However, many countries are aggressively invested and developed semiconductor related businesses and technologies in recent years which will affect the semiconductor industries of Taiwan with massive competition. How to maintain the competition advantages including technologies, qualities, and services in the semiconductor industries become the major challenges of Taiwan. These bloody competitions will affect not only the frontend of the semiconductor industries such as wafer foundry but also the backend such as assembly and testing turn-key services. How to provide real-time information to customers for making the best decisions in the shortest time to win more business opportunities and to gain more market shares among the competitors becomes the best tactic. Therefore, customers will become more than customers but strategic partners to create win-win business environment and to gain more energy for competition in the long run.
In this study, RFID system were implemented to construct “Real-time information sharing system in semiconductor wafer testing fab” which was composed by three major modules, logistic information module for supplier chain management, inventory information module for location identification and management, and wafer testing information system for wafer testing operation and management to integrate semiconductor infrastructure from IC design, through IC fabrication, to IC testing and packaging including real-time management of materials, processes, inventories, fabrication status, yield control, cycle time, and shipping/ receiving schedules to achieve shorter cycle time and lower manufacturing costs leading to better competitions in the market. RFID technology is implemented in the operation environment such as shipping/ receiving docks, testers, nitrogen cabinets, and trolleys where wafer cassettes and probe cards are the major tracking objects to provide automation of shipping/ receiving management, wafer testing processes, and inventory management to achieve automation and real-time management for semiconductor infrastructure.
Furthermore, the implementation of RFID in actual production environment of wafer testing foundry was evaluated and verified through the integration of “RFID technology” and “information system” to reduce cycle time, to increase productivity, to accurately control the logistic, to improve production flow, to enhance process automation and monitor, and to provide complete information management of wafer testing. Through this real-time information sharing system, the top managers will be able to respond to the fast changing of the business world and to make real-time monitor and decision so that the information flowing in the semiconductor infrastructure from IC design, through IC fabrication, to IC testing and packaging will be real-time and transparent to improve the unstable wafer supply in the supplier chain, to meet frequent changing of customer requests, to accommodate urgent orders, and to avoid false information and misunderstanding to effectively shorten the cycle time and to reduce the cost to enhance the competition in the backend semiconductor industries.

並列關鍵字

wafer ； probe card ； RFID ； inventory management ； logistic information ； wafer testing information ； real-time information

參考文獻

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