高照度發光二極體平行陣列光源模組

目前各種光電產品解析度已愈來愈高，為符合解析度檢驗需求，以高畫素線型CCD執行檢測的設備已陸續被開發出，同時也因產品全檢需求愈來愈多，為了達到高速檢測的目的，檢測時的線掃描率常超過10kHz以上，這些高速高解析度的設備常會有畫素感光面積小、曝光時間短的困擾，故高照度光源的需求也同時開始提高，本研究遂針對上述需求，設計出一組高照度光二極體平行陣列光源模組化系統，以提供高畫素線型CCD檢測設備使用。本模組化系統在設計時係將光源分成兩組相互平行的陣列，可分別同時做前後移動及角度變換，實驗時主要是依據兩平行光源的距離、角度及光源至待測物的高度距離等參數進行調整，透過比對各種參數變化下所得到之亮度，進而找出一組最亮光源的搭配條件。實驗結果顯示目前設計的光源模組在距待測物高度距離10公分處以15°角斜向入射時，置於中央位置上方的CCD將可以得到最高之照度，且兩平行光源間距變化對CCD所擷取亮度之改變影響不大。

關鍵字

線型CCD ；高照度；光二極體；平行陣列光源模組

並列摘要

The high-resolution linear CCD detector equipment was developed recently to meet the demand of high resolution product testing, cause of the resolution of electro-optical products are getting higher and higher currently . In order to meet the demand of piece by piece product testing, the scanning rate is often over 10kHz to provide high-speed testing. These high speed/resolution testing equipment’s often suffers from the shorter exposure time cause of the pixel sensitive area are getting smaller. Therefore there is a increasing need of back-light module with high-Illuminance light source. Based on above needs, this project designs A Parallel Array Light Source Module Using High-Illuminance LEDs for high-resolution linear CCD detector equipment. The module divides light source into two parallel arrays which can be moved back and forth, respectively, and angular transformation. Parameters adjustment are mainly based on the distance between the two parallel light, angle and height of the light source to the testee. Through comparing a variety of parameters obtained, we find out the best conditions set of brightest light source. The experiment result shows that highest illuminance can be obtained when the module is at the height of 10 cm to the testee with 15 ° angle oblique incidence, and place CCD in the central top location of it. We also found that there is few influence for the CCD brightness capturing at the distance change between the two parallel light.