摘 要 有很多方法適用於穩健性系統中取得一個最佳組合。而其中田口方法(Taguchi method)之優點是能夠在所選擇的因子中,利用直交表規劃最少的實驗次數,並將系統的使用環境中不可控但會影響品質特性的因素加入實驗,而得到穩健性的效果。有關田口方法運用在電子零件配置對系統最佳化方面的文獻較少見。本研究將田口方法運用在太陽能電力調節器中的電源供應器模組,對變壓器溫昇問題選出六個主因子及二個雜因因子進行實驗,六因子中有二個兩水準及四個三水準,由於標準的直交表無法套用,故進行對標準直交表的修改,雖然第一次實驗失敗,但因此獲得寶貴的因子選取資訊,在進行第二次實驗後,終於得到最具穩健性的因子組合。 風扇轉換式電源供應器(Fans Switch Power Supply)模組常運用於電源供應器(Switch Power Supply, SPS)及電力調節器(Inverter)產品上。而模組上的變壓器常因溫度昇高而失效,進而導致整個風扇模組失效。失去散熱的功能後,整個機器也停止運作。像這種因電子零件溫昇而導致機器失去功能的情形,是一直存在於類似的產品中。然而,在業界中常用的方法是使用試誤法(Trial and error)或經驗法則來設計系統中電子零件之規格配置,不但研發的時間較長,成本高且系統較不具穩健性。 本研究將實驗結果的最佳因子組合進行確認實驗動作,得到比現行案例公司產品更好的效果。包括平均溫度降低了15.48℃,S/N比提高了4.62 db,以及當外在溫度及輸入電壓達到產品最高限定值時,變壓器溫度低於規格值。而原設計在同樣條件下,變壓器溫度會超過規格值。這也證明了田口方法一樣可運用在電子零件之配置最佳化,系統更具穩健性。本研究可提供相關產業對電子零件溫昇問題的參考,若能正確使用田口方法在此類問題中,必能快速有效建立其系統穩健性。
Abstract Many approaches can apply to search a optimum combination on robust system required. The advantage of Taguchi Method is that it could achieve minimum experiments by Orthogonal Array(OA) with chosen elements, and added the factors which are uncontrollable but quality effective into experiment to gain robust performance. Related reference of Taguchi Method applying to electronic component layout is seldom. This study which applies to Taguchi method on SPS module of PV Inverter product, proceeding experiment for transformer temperature rising issue by selecting six main factors and two noise factors. There are two level 2 factors and four level 3 factors in six main factors. Due to the standard OA can not be used in them, it was modified to fit this experiment design. Although the first time experiment was not successful, this study had gained valuable information of factor selection. After second experiment, we finally found the most robust factor combination. The module of fans switch power supply often apply to Switch Power Supply(SPS) and Inverter product. However the transformer on module usually fails because of temperature rise issue and that causes the whole fans module fails. After losing heat sink function, the machine would shut down. The circumstance such as electronic components temperature rising always exists on similar kinds of products. In relevant fields, the methods of Trial and Error or rule of experience are often the solutions for temperature rising issue on electronic layout design. It is not only time consuming, high cost, but also not able to keep system robust. This study implemented a confirmation experiment for best factor combination. It gained better result then the products of current cases including average temperature drop 15.48℃, S/N ratio went up 4.62 db, and the temperature of transformer is lower then specification limitation when input voltage and environment temperature reach to the maximum limitation. The temperature of original transformer design is higher then specification limitation temperature in the same conditions. This proves that Taguchi Method could also be applied to the best method of electronic components layout and makes the system more robust. This study can be provided as a reference for temperature rising issue of electronic components to relative industries.