奈米粉末幾何特性影像量測系統之建立

The development of a visual method to quantify geometric characteristic of nano-scale particles

李正國(Cheng-Kuo Lee)

國立虎尾科技大學/工程學院/動力機械工程研究所/碩士(2005年)

摘要

本研究自行研發影像程式集，結合穿透式電子顯微鏡，建立適合於奈米粉末幾何特性量測之影像系統。本系統可提高所拍攝之奈米結構影像之清晰度及可讀性；分析各奈米級粒子之面積、周長，並計算其等效直徑、真圓度、形狀因子、緊實度等幾何特性，及獲得平均粒徑及粒徑分佈。
本研究所分析之影像顯示，非球狀之奈米粒子相當普遍。而現有之粒徑量測儀器，均假設奈米粉末為球狀；可藉本研究所提供之真圓度、形狀因子、緊實度等幾何特性，校正其量測誤差。這些幾何特性，亦可做為奈米粉末之分級、品質管制的依據。本研究未來將與業者合作研發奈米粉末之篩選、分級系統，找出最佳之分離參數、及操作程序，以窄化奈米粉末之尺寸分佈範圍。

並列摘要

The study successfully developed a visual method to quantify geometric characteristic of nano-scale particles, which combined TEM (Transmission Electron Microscope) and a set of image processing programs. The programs were used to increase the readability of the image of nano-particles obtained by TEM, and to quantify the area, perimeter, equivalent diameter, roundness, shape factor, and compactness of interested objects.
The results show that nano-particles are usually non-spherical or of irregular shapes. The theories of the existing instrumentation to measure nano-particles are usually based on the assumption of the spherical particle. Measurements of shape factor, and compactness may be used as correction factors to the errors of such instrumentation to measure nano-particles. These measurements may also be used as indices to represent the irregularity, or to classify the qualities of particles. The study plans to develop a sieving system, with the powder industry, which can narrow down the band of the size distributions of the particles by optimizing the operation parameters.

參考文獻

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