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  • 學位論文

高精度線性及旋轉平台技術開發

Development of a High Precision Technique for the Linear and Rotary Stage

指導教授 : 陳世欣
共同指導教授 : 覺文郁
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摘要


本論文在ROLL的加工設備主要建立兩項關鍵次系統:(1)高精度旋轉平台 (2) 高精度單軸線性平台。 高精度旋轉平台包含三個部分,第一個部分為利用無心旋轉馬達及壓電角定位補償平台所組成的旋轉平台系統,第二個部分為兩個壓電驅動器所組成的二自由度補償平台,第三個部分為環型光學尺及玻璃球量測系統(雷射光束搭配光電位移感測器以及球形透鏡所組成)量測旋轉軸誤差。可將無鐵心旋轉馬達在旋轉時所產生的誤差量回饋,並進行補償與控制。 高精度單軸線性平台包含三個部分,第一個部分為利用交流伺服馬達及單軸移動線性模組所組成的單軸線性移動平台,第二部分為利用壓電致動器推動之壓電定位補償平台。第三個部分為一組雷射干涉儀,量測平台移動時所產生的定位誤差,回饋誌控制器進行補償與控制。 以PID控制器進行壓電平台之控制及無鐵心旋轉馬達之控制,達到補償之效果。

並列摘要


In the micro-nano fabrication technology, the working motions are classified as linear motion and rotary motion. Because the development of the latter mainly depends on multi-axis equipment and Roll to Roll (R2R) equipment, the positioning accuracy of rotating axis is very important in the precision machinery. At present, the main problems consist in positioning errors of rotating axis and measuring errors of roundout. Therefore, aiming the above existing problems in this project of two system, the small angular errors by piezoelectric transducer (PZT) stage will be compensated in order to enhance positioning accuracy of rotating axis, and the optical rotary measurement system will be developed with the optical lever theorem and the half- reversal technique to reduce centering error of rotating axis. The subsystems will be developed in the, which include a high-precision rotary piezoelectric indexing table, a high-precision multi-DOF single-axis piezoelectric stage, an optical rotary measurement system with ball lens, and a multi-DOF laser interferometer feedback system. In the second system, this paper presents the assembly of a nano PZT stage with interferometer feedback using multi PZT stage control system. This nano-stage integrates a single-axis long-stroke stage of linear displacement platform and a PZT stage by using piezoelectric actuator. The linear displacement platform can’t be controlled at high accuracy, thus, the Positioning error PZT stage is designed to compensate yaw errors in order to achieve the.

參考文獻


[23] 陳俊仁,” 使用雷射四象儀檢測精密機具性能’ 國立成功大學機械工程學系碩士論文,2002年
[16] Wen-Yuh Jywe, Yeau - Ren Jeng, Yun-Feng Teng, Chia-Hung Wu, Hung-Shu Wang and Yi-Jou Chen, “A novel 5 DOF thin coplanar nanometer-scale stage”, Accepted to Precision Engineering, 2008/1
[9] S. H. Chang, C. K. Tseng, and H. C. Chien, “An Ultra-Precision XYθZ Piezo - Micropositioner PartⅠ:Design and Analysis”, IEEE Transaction on Ultrasonic, Ferroelectrics, and Frequency Control, Vol. 46, no. 4, 1999, pp.897-905.
[10] S. H. Chang, C. K. Tseng, and H. C. Chien, “An Ultra-Precision XYθZ Piezo - Micropositioner PartⅡ:Experiment and Performance”, IEEE Transaction on Ultrasonic, Ferroelectrics, and Frequency Control, Vol. 46, no.4, 1999, pp.906-911.
[41] C. K. Lee*, G. Y. Wu, Thomas C. T. Teng , W. J. Wu, C. T. Lin, W. H. Hsiao, H. C. Shih, J. S. Wang ,Sam S. C. Lin, Colin C. Lin, C. F. Lee, and Y. C. Lin, “A High Performance Doppler Interferometerfor Advanced Optical Storage Systems,” Japanese Journal of Applied Physics, Vol. 38, Part 1, No. 3B,pp. 1730-1741 (March 1999).

被引用紀錄


郭峰碩(2014)。奈米級定位平台控制與可靠度測試〔碩士論文,國立虎尾科技大學〕。華藝線上圖書館。https://www.airitilibrary.com/Article/Detail?DocID=U0028-2008201419523000

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