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  • 學位論文

網絡觀點下的專利分析:以科技產業為例

Patent analysis from the perspective of network: The case study in technology industry

指導教授 : 洪秀婉
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摘要


專利分析是一種評估技術演進的方法,若能有效的運用專利分析所提供的資訊,對於企業技術策略的制定能夠產生相當的助益。有別於以往專利指標或專利引證分析,本研究基於網絡的觀點提出了一套具有能夠分析多方專利關聯性以及產業專利佈局的專利分析法。多方專利關聯性的確立讓我們能夠由點至面的角度去觀察特定專利的影響力,而產業專利佈局的觀察讓我們有足夠的資訊去了解現行技術的發展。藉由上述兩個面向的觀察,可以讓決策者清楚的知道需於何種領域,發展可以對產業其他技術產生影響力的專利技術,以增加企業技術發展的機會。本研究主要以小世界網絡及社會網絡兩種類型的網絡觀點來輔助專利的分析,並藉由檢驗RFID、奈米及LCD三個科技產業的專利文獻來驗證本研究所提之方法可行性。在小世界網絡觀點中,本研究檢驗RFID產業的專利引用網絡,並藉此觀察專利網絡結構及專利引用的行為。專利結構與引用行為的觀察,有助於我們對於產業專利間的關聯性進行整體性的觀察。而在社會網絡觀點中,則是以動態及靜態兩個面向進行探討。在動態分析方面,本研究透過觀察奈米產業專利技術的申請,來了解專利技術的演進。而知曉技術演進的歷程可以幫助決策者擬定現在與未來的技術發展方向。而在靜態的分析中,主要是透過既有的LCD專利引用結構去探索關鍵的專利技術,關鍵專利技術的確認將能幫助企業評估自身技術的優勢與劣勢,進而發展合適的技術策略。最後本研究發現我們所提出的專利分析法,不但可以有效的觀察到上述的現象,對於專利資訊的分析也是全面且恰當的。

並列摘要


Patent analysis is a method to assess the evolution direction of a specific technology, if we can utilize the knowledge revealed by patent analyses more effectively and precisely, it will helps the company to formulate the basis of policy for research and development. Different from the previous studies, we propose a method based on the network view that can analyse the correlation between two or more patents and industrial patent deployment. By identifying the correlation between two or more patents, the influence of these patents will be identified from points to surfaces. Furthermore, the observation of industrial patent deployment provides sufficient information to help us understand the current technology development. By conducting the aforementioned analysis, it will help the policy maker make a patent application that with influence in the appropriate technology field. In this study, we will integrate the small-world network and social network into the patent analysis and take the RFID, Nano and LCD industry as example. From the perspective of small-world network, this study examines the patent citation network of RFID industry to explore the structure of patent networks and the behavior of patent citation. It will provide us a full view and much information for observing the correlation between patents of industry. For a view of dynamic analysis, we investfigate the evolution of patent technology by exploring the patent application of Nano industry. Understanding the evolution of patent technology will help the policy maker make the direction of technology development for current stage and future. From a static point of view, we will identify critical patents in the LCD patent network and the influence of these patents. By identifying the critical patents, we can evaluate advantage and disadvantage of our technology and developing an appropriate technology strategy. According to the results of three cases conducted for this study, the approach proposed demonstrates an appropriate way for analyzing patent information.

參考文獻


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