使用封閉式非平衡磁控濺鍍方式,在玻璃及矽晶片的基才上,濺鍍錫-銦氧化物薄膜。利用實驗可以得到氧氣分量、氬氣壓力、被鍍物與靶材的距離、濺射功率對於錫-銦氧化物薄膜的透光率、電阻以及薄膜厚度的影響,並且討論試片經過退火處理以及多層膜的處理後,其電阻及透光率的改變程度。
In this preliminary study, a closed-field unbalanced magnetron system was used to sputter the ITO (indium-tin oxide) on glass and silicon wafer substrate, respectively. The effects of process parameters, such as oxygen flow rates, partial argon pressure and distance between target and substrate, on the photoelectric properties of ITO films were investigated. It was found that the oxygen flow rates had profound influence on the volume resistance of the films. Post annealing and multi-layered structure could significantly improve the conductivity of the films.