電子產品在研發過程中,須要經過無數次的測試及修正才能製造出穩定的產品,故如何以最少測試次數及時間,來達到最大的測試涵蓋率,成為縮短研發週期的重要因素。 在本論文中,首先探討伺服器的傳統測試方法及田口方法之直交表,在傳統測試方法中,研發人員以過往的工作經驗來排定傳統測試計畫,但通常因個人的偏見導致測試涵蓋率降低,故利用田口方法之直交表來改進,首先分析測試產品之控制因子、水準及適合使用之直交表,進而產生直交測試計畫,該計畫與傳統測試計畫分析比較後,直交測試計畫能夠以較少的測試次數,來達到最大的測試涵蓋率,證明其能夠有效的減少測試時間來縮短研發週期。
Electronic products, in the development stage, need to go through numerous tests and be corrected in order to create a stable product. Therefore, how to minimize number of tests and time to achieve maximum test coverage has become an important factor that shortens the development cycle. In this study, we first discusse the traditional server testing methods and orthogonal array of Taguchi’s method. In the traditional test method, developers are based on historical experience to schedule the traditional test plan. However, it is freqently that, due to personal biases, testsing cover rate is consequently decreased, This condition can be ameliorated by using orthogonal array of Taguchi’s method. In our implementation, we firstly constructed control factor, level and orthogonal array of the test products, to produce orthogonal test plan. In comparison to the traditional test plan, the orthogonal test plan uses fewer number of test cases while achieves maximum test coverage. From the experimental results, it is apparently our method can effectively reduce the test time and shorten the development cycle.
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