- 學位論文
臨場觀測疊差對銀奈米線於電遷移的影響
In-situ TEM observations of the effects of stacking faults on the electromigration of Ag nanowires
延伸閱讀
- 侯蘊芳（2011）。鎳奈米線受磁場影響之熱傳導性質研究〔碩士論文，國立清華大學〕。華藝線上圖書館。https://www.airitilibrary.com/Article/Detail?DocID=U0016-1511201113561392
- 吳道軒（2005）。多層奈米結構表面對表面電漿子耦合之影響：奈米直寫儀光學頭耦合能量增強之設計與研製〔碩士論文，國立臺灣大學〕。華藝線上圖書館。https://doi.org/10.6342/NTU.2005.00961
- Li, C. H. (2022). 側向奈米孔洞對福斯特共振能量轉換與表面電漿子耦合影響的模擬研究 [master's thesis, National Taiwan University]. Airiti Library. https://doi.org/10.6342/NTU202203060
- Lan, Y. W. (2012). A Correlated Analysis of Defect in Nanostructures with TEM Inspection and Electrical Characterization [doctoral dissertation, National Taiwan University]. Airiti Library. https://doi.org/10.6342/NTU.2012.01036
- 蔡昀嶧、曹勝宥、溫政彥（2014）。Electron Microscopy Analysis of SiGe Alloy Nanowires and SiGe/Si Axial Heterojunction Nanowire Structures。國家奈米元件實驗室奈米通訊，21(2)，29-35。https://www.airitilibrary.com/Article/Detail?DocID=1029502x-201406-201408070019-201408070019-29-35