隨著基因檢測技術日趨成熟及效率不斷提高,其相關產品逐漸從實驗室走向一般民眾的生活,基因檢測應用領域涵蓋遺傳疾病檢測、個人健康檢測與母體產前檢測等,透過基因檢測技術可降低人類的疾病。基因晶片為基因檢測技術之核心工具之一,晶片封裝於塑膠件中,若塑膠件於超音波熔接過程中嚴重變形,會間接使得晶片檢測功能嚴重失效,導致檢測失敗。因此,本研究之主要目的是以國內某家基因檢測儀器與基因晶片製造商為案例,應用實驗設計法於超音波熔接製程中,找出造成塑膠件變形的顯著因子,再應用反應曲面法中之面心立方中心混成設計(The Faced Center Cube Central Composite Design, FCCD)找出超音波熔接製程之最佳參數設定值,以有效改善塑膠件變形的問題。本研究求出之製程最佳配方經驗證後,顯示塑膠件變形得到明顯的改善,大幅降低了不良率,且因減少報廢,同時也達到降低生產成本的效益。
As the technology of genetic testing gets mature, the testing efficiency is improved significantly. Utilization of many products related to the genetic testing are gradually moving from laboratory to ordinary people. The application fields of genetic testing include genetic disease testing, personal health testing, and non-invasive prenatal testing. Genetic testing technology is expected to decrease the hazards of disease. However, the gene chip, which is one of the core tools of genetic testing will be packaged in plastic parts. If the plastic parts are severely deformed during the ultrasonic welding process, it will indirectly make the detection function of the chip seriously ineffective and cause detection failure. In this study, a domestic manufacturer of gene testing instruments and gene chips was used as a case company. The design of experiments (D.O.E) was employed in the ultrasonic welding process to find out the significant factors that cause poor deformation of plastic parts. The Faced Central Composite Design (FCCD), one of the Response Surface Methods, is used to find out the optimal parameter-level setting to improve the problem of poor deformation of plastic parts. After verification of the optimal parameter-level setting obtained in this study, it is shown that the deformation problem has been significantly improved, and the defect rate has been greatly reduced. At the same time, the proposed method can also significant reduced scrap and production costs.