TFT array is a matrix-like structure which contains thousands to millions pixels to display information. However to it’s difficult to make sure that the TFT panel manufactured is no-defect which means all the pixels are well and all the metal wires are continuous. Therefore it’s necessary to test the array including the wires and the pixels. For testing the TFT array, large probes number of ATE and long testing time are needed traditionally. To improve this, this thesis proposed two built-in self-test techniques for testing the pixels and the scan/data line respectively. Both the technique can also be applied into SoG (System on Glass) concept.