摘要 本研究主要目的是探討半導體後段製程中,在測試完成後,為確保產品外觀品質,且不使不良品流向客戶端,所以建立一動態目視檢驗作業程序,以降低在封裝及測試生產過程中,造成產品外觀瑕疵品之流出。 目視檢驗如同其它檢驗系統一樣,均有拒收良品與允收不良品等兩種誤差的產生。本研究分資深與新進兩組人員進行實驗,以十二位受測者(六位資深受測者,從事此工作1年;六位新進受測者,從事此工作1個月),利用訊號偵檢理論(Signal Detection Theory)分別在不限制時間與限制時間之下進行檢驗材料,對於資深作業者與新進作業者所發生錯誤次數之影響。 資深人員在不限時間目視檢驗實驗中,因有充分時間檢驗材料,其結果為假警報(False Alarm)多,造成良品誤判為不良品較高。然而在限時間目視檢驗實驗中,因材料在檢驗中移動速率快,人員在有限時間下檢驗材料,其結果失誤(Miss)多、正棄(Correct Rejection)少,造成不良品誤判為良品。 新進人員在不限時間目視檢驗實驗中,因有充分時間檢驗材料,其結果均比在限制時間目視檢驗正確率高。 從本實驗分析,資深人員與新進人員在訊號偵檢中其最大不同之處,是在限制時間下其資深人員假警報(False Alarm)少,新進人員則反之。 關鍵字:訊號偵檢理論、視覺績效、動態視覺檢驗
ABSTRACT The main purpose of the research is discussing about the back-end process of semiconductor that after testing process, in order to ensure products appearance quality, and avoid the defects flow to the customers, building up a dynamic visual inspection procedure to reduce the possibility of the defects flow to the customers while assembling and testing. Visual inspection is the same as other inspection systems; they both have rejecting good products or accepting defective products problems. The experiment of the research is divided into a senior group and a novice group. 12 operators(6 of them are senior who have 1-year work experience; 6 of them are novice who have 1-month experience.)have been surveyed; using signal detection theory, process the materials with limited and unlimited time. The affection results of mistake frequency of senior and novice operator made: While unlimited time visual inspection experiment, the senior operators have enough time to inspect materials, but there’re many “False Alarm” which cause erroneous that misjudge good products into defective products. While limited time visual inspection experiment, the speed of material movement is very fast. The senior operators inspects the material within limited time that cause many “Miss”, less “Correct Rejection”, and misjudge defective products into good products. While unlimited time visual inspection experiment, because of unlimited time, the correct ratio is higher than the correct ratio of limited time inspection. Analyzing the research, the biggest difference between senior operators and novice operators is while limited time inspection, senior operators have less “False Alarm”, on the contrary, the novice operators have many “False Alarm”. Key words: Signal Detection Theory, Vision Achievement, and Dynamic Visual Inspection.
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