消費性電子產品壽命分析-以行動裝置顯示器為例

Reliability Analysis of Consumer Electronics－Use Panel of Mobile Device as Example

戴宇軒(Yu-Shiuan Dai)

指導教授 ： 黃乾怡

國立臺北科技大學/管理學院/管理學院工業工程與管理EMBA專班/碩士(2013年)

https://doi.org/10.6841/NTUT.2013.00445

摘要

隨著科技的進步，消費性電子產品(Consumer Electronics)的設計開發人員融合更多需求元素，整合至單一產品中，使具備多功能和多媒體融合。開發可靠且具成本效益的產品，成為重要的課題。各產業大多已導入可靠度環境應力測試，但在壽命預估技術的應用上並不普遍。如何正確預估產品壽命將是重要議題，同時也左右廠商的信譽。
工程人員大都採用高於正常使用環境的溫度、濕度或震動等的環境條件來縮短驗證時間。活化能可視為如溫度、濕度等環境因素影響產品所產生的效應或綜合指標，也是在推估產品壽命加速因子中之重要條件參數。但活化能數據取得困難及費時，常以假設值直接代入，但因選用的數值不同而使得推估的壽命時間產生極大差異，容易導致客戶對產品預估壽命結果產生疑問或不信任。
本研究以低溫多晶矽薄膜電晶體液晶顯示器面板為研究對象，執行加速壽命試驗以40℃/RH90%、50℃/RH90%、60℃/RH90%及60℃/RH60%條件下之四個溫度、濕度應力水準加速產品失效，並蒐集樣本失效數據。本實驗假設失效數據服從韋伯分佈求出特徵壽命及形狀參數，然後運用Arrhenius模型進行分析，計算各溫度水準下之加速因子40℃為1.36、50℃為1.64、60℃為1.95；活化能為0.16eV，對應之產品正常使用下壽命為2599小時。由於Arrhenius模型演算上僅針對溫度會產生影響運算上僅使用到溫度參數。因此同時用Peck's Combination模型驗證加入濕度後的影響，進而推算產品預估壽命及兩模型差異。發現溼度對於本實驗樣品有高度影響，對於加速因子也產生變化40℃/RH90% 從1.36上升為1.75 、 50℃/RH90% 從1.64上升為2.11 、 60℃/RH90%從1.95上升為2.51及原Arrhenius模型未使用到實驗參數60℃/RH60% 則為1.95。而其常溫下之壽命預估值也因考慮溼度影響由2599小時調整為2576小時。本研究也證明於產品加速壽命實驗參數規劃上必須考量產品對於特定環境因素的敏感特性，以免造成壽命預估實驗結果偏差。

關鍵字

壽命預估 ； 活化能 ； 加速壽命試驗 ； 可靠度 ； Arrhenius

並列摘要

With advances in technology, consumer electronics product development personnel combined with more elements into a single product that has multifunctional and multimedia integration. Development of reliable and cost-effective products, has become an important issue. Most of industrial has been imported reliability stress testing, but for the estimated life of the product technology is not common. How to correctly estimate the product life will be an important issue, but also about the vendor's credibility.
Engineers use higher than normal on the use environment such as temperature, humidity, or vibration test conditions to reduce verification time. Activation energy can be considered such as temperature, humidity and other environmental factors affect the resulting effect or composite indicators, but also to estimate the acceleration factor in the life of the product important condition parameters. However, the activation energy data acquisition difficulties and time-consuming, often assumed values referenced directly, but use different values to estimate the life of the time and makes a tremendous difference, easily lead to the customer's questions or distrust for estimated lifetime results.
In this study, low-temperature poly-silicon thin-film transistor liquid crystal display panels as the research object, perform accelerated life test to 40 ℃ / RH90%, 50 ℃ / RH90%, 60 ℃ / RH90% and 60 ℃ / RH60% under the four conditions of temperature, humidity stress levels which accelerate product failure, and collection failure data of sample. The experimental data fit Weibull distribution assumption, find the characteristic life and the shape parameter, then use the Arrhenius model analysis to calculate the acceleration factor under levels temperature at 40 ℃ is 1.36, 1.64 at 50 ℃, at 60 ℃, is 1.95; Activation energy is 0.16eV, corresponding to the life of the product under normal use is 2,599 hours. Since Arrhenius model calculation is only an impact on the temperature calculated using only the temperature parameter. Therefore the same time with Peck's Combination model validation increased humidity; thereby calculate estimated product life, and two model differences. For this experiment found that humidity of the sample have a high impact, for the acceleration factor also produce changes 40 ℃ / RH90% increase from 1.36 to 1.75, and 50 ℃ / RH90% increase from 1.64 to 2.11, and 60 ℃ / RH90% increase from 1.95 to 2.51 Arrhenius model and the original unused to the experimental parameters 60 ℃ / RH60% was 1.95. The room temperature values of life prediction considering the effects of humidity from the original 2599 hours adjusted to 2576 hours. This study also demonstrated the product accelerated life test planning must consider the product in the parameter for the sensitive nature of certain environmental factors, in order to avoid life prediction results bias.

並列關鍵字

Life prediction ； Activation Energy ； Accelerated Life Test ； Reliability ； Arrhenius

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