64. D. D. L. Chung, P. W. De Haven, H. Arnold, D. Ghosh, “X-Ray Diffraction at Elevated Temperatures: A Method for In-Situ Process Analysis”, VCH Publishers, New York (1993).
Lin, C. C. (2006). 中孔洞二氧化矽、金屬與高分子之共嵌入化學 [master's thesis, National Tsing Hua University]. Airiti Library. https://www.airitilibrary.com/Article/Detail?DocID=U0016-1303200709301005