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  • 學位論文

工業電腦主機板高速訊號線訊號完整度分析與等化器設計

Signal Integrity Analysis and Equalizer Design for High-Speed Interconnects in Industrial Personal Computer Mother Board

指導教授 : 吳瑞北

摘要


在工業電腦的多層印刷電路板當中,常見許多不連續結構,例如:連通柱與焊墊。隨著資料傳輸速率達到Gbit/s 以上時,這些不連續結構對於信號完整度的影響就必須要被考慮。 為了改善高速訊號完整度於傳輸通道眼圖的電性表現,本論文在差模連通柱殘段的末端使用電阻與電感組成的等化器,並提出一套完整的設計流程來加以設計。並且利用模擬軟體與量測散射參數,就眼圖結果來驗證此方法的正確性。為了減少反射雜訊,本論文使用在焊墊下開槽洞與在差模連通柱使用膠囊狀清潔環的補償方式,來減少訊號的反射。

關鍵字

等化器 眼圖 連通柱殘段 焊墊

並列摘要


There are many discontinuities in the industrial personal computer printed circuit board, such as the via and pad. As the transmission data rate exceeds several Gbit/s, the discontinuities have the serious impact on the signal integrity. To improve the signal integrity on the eye-diagram performance of high-speed channel interconnection, this thesis used the resistor and inductor attached at the via stubs as an equalizer and proposed a design flow, accordingly. The design flow was verified between the simulation tools, scattering parameters, and eye measurements. To reduce the reflection noise, this thesis used the defected ground under the pad and the differential vias with the capsule-shaped anti-pad.

並列關鍵字

equalizer eye diagram via pad

參考文獻


[12] 郭維德,印刷電路板級損耗傳輸線之眼圖分析與補償設計,國立台灣大學博士論文,2008年10月。
[1] T. Kushta, K. Narita, T. Kaneko, T. Saeki, and H. Tohya, “Resonance stub effect in a transition from a through via hole to a stripline in multilayer PCBs,” IEEE Trans. Microw. Wireless Compon. Lett., vol. 13, no. 5, pp. 169–171, May 2003.
[2] S. Deng, J. Mao, T. H. Hubing, J. L. Drewniak, J. Fan, J. L. Knighten, N.W. Smith, R. Alexander, and C. Wang, “Effects of open stubs associated with plated through-hole vias in backpanel designs,” in IEEE Int. Symp. Electromagn. Compat., Santa Clara, CA, USA, vol. 3, pp. 1017–1022, Aug. 9-13, 2004.
[3] H.-H. Jhuang and T.-W. Huang, “Design for electrical performance of wideband multilayer LTCC microstrip-to-stripline transition,” in Proc. 6th Electron. Packag. Technol. Conf., Singapore, pp. 506–509, Dec. 8-10, 2004.
[5] K. Soorya Krishna and M. S. Bhat, “Impedance matching for the reduction of via induced signal reflection in on-chip high speed interconnect lines,” in IEEE Int. Commun. Control Comput. Tech. Conf., Tamilnadu, India, pp. 120–125, Oct. 7-9, 2010.

被引用紀錄


陳泳霖(2014)。應用於工業主機板之DDR3記憶體訊號及電源完整度共模擬與分析〔碩士論文,國立臺灣大學〕。華藝線上圖書館。https://doi.org/10.6342/NTU.2014.01290
黃捷允(2013)。利用集總節點分析電源完整性與去耦合電容最佳化擺置〔碩士論文,國立臺灣大學〕。華藝線上圖書館。https://doi.org/10.6342/NTU.2013.01751

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