Recent advances in magnetic instrumentation and measurement techniques are first reviewed followed by the presentation of some new experimental results. In keeping with the frontier theme, emphasis is placed on instrumentation systems for the study of magnetic thin films and surfaces. Such new techniques as Scanning Electron Microscopy with Polarization Analysis (SEMPA), Magnetic Force Microscopy (MFM) and Magnetic Domain Spectroscopy System (MDSS) are examined. Application of thin films to digital magnetic recording is also breifly discussed.