類比數位轉換器設計與測試策略概論及其未來應用

Overview of Design and Testing Strategies for Cutting Edge ADCs and Future Applications

鄭乃禎(Nai-Chen Cheng) ； 黃俊郎(Jiun-Lang Huang) ； 黃炫倫(Xuan-Lun Huang) ； 李瑜(Yu Lee)

《電腦與通訊》 132期 (2010/04) Pp. 86-93

https://doi.org/10.29917/CCLTJ.201004.0013

摘要

類比數位轉換器一直扮演著外在類比世界及數位世界的溝通橋梁，因製程不斷往低電壓及奈米世代發展，其帶來的衝擊使得類比數位轉換器的設計手法不斷演進。文中將對近幾年文獻中具有代表性的類比數位轉換器進行介紹，如採分離式類比數位轉換器之數位背景校正方法、跨極點偵測器為主的類比數位轉換器、壓控振盪器為主的類比數位轉換器、及非同步之漸進式類比數位轉換器等。最後並以三維積體電路中的影像感測器應用為例，說明未來可能的發展方向。

關鍵字

類比數位轉換器 ； 數位背景校正 ； 漸進式類比數位轉換器

並列摘要

Analog to digital converter (ADC) is the bridge of communicating between the analog and digital world. With the process evolving, the supply voltage shrinks and the noise issue becomes more severe, how to build a high performance ADC while remaining very low power becomes more challenging. This article briefly introduces several emerging ADCs including split-ADC based digital calibration technique, zero-crossing detector (comparator) based ADCs, VCO (noise-shaping quantizer) based ADCs, and asynchronous successive approximation ADCs. Later on, an application for the 3DIC CMOS image sensor is discussed, and finally concludes the potential expansion in the future.

並列關鍵字

Analog to Digital Converter ； Digital Background Calibration ； Successive Approximation Analog to Digital Converter