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掃描電子顯微／X射線能譜分析法在微量證物鑑識的應用
Applications of Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry to Forensic Examination of Trace Evidence
摘要
掃描電子顯微／X射線能譜分析法是發展成熟的分析方法，可同時觀察微量物證的顯微形態特徵並進行非破壞性的多元素分析，使其在鑑識科學廣被應用。本文介紹其在射擊殘跡、火工品爆燃殘跡、射擊後彈頭微物、電焊殘跡、砂輪機殘跡與打火機殘跡等微量證物鑑定上之應用。
關鍵字
無資料並列摘要
Scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) is a well developed analytical method. SEM/EDS's capability to simultaneously perform morphological and multi-elemental analysis of trace evidence leads to its extensive application in forensic examination of physical evidence. Herein, we briefly described application cases such as gunshot residues, pyrotechnics deflagration residues, trace evidence on fired bullets, stick welding residues, disc grinder residues, and lighter flint residues by SEM/EDS forensic examination.
並列關鍵字
無資料延伸閱讀
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