透過您的圖書館登入
IP:3.149.255.162
  • 期刊

Shewhart、CUSUM與EWMA計數值管制圖之品質偵測能力比較研究

A Comparative Study on Shewhart, CUSUM and EWMA Attribute Control Charts

摘要


根據以往研究指出,當製程產生大偏移時,Shewhart管制圖有不錯的偵測效果,但對現今產品設計以高品質為目標而言,大偏移之監測能力已不足以滿足需求,故當製程有微量變異時,應使用EWMA管制圖或CUSUM管制圖來監測製程。當製程品質水準在管制範圍內時,此時希望ARL_0越大越好;反之,當製程品質水準在管制範圍外時,則希望ARL_1越小越好。故本研究將探討Shewhart管制圖、CUSUM管制圖與EWMA管制圖分別在不同的品質特性下,何者管制圖之偵測績效較佳。最後,本文提出7點具體結論供後續研究及實務應用上參考。

並列摘要


Based on literature review, when the process has a large change, Shewhart control chart's detect effects will better than the others. But for today's high-quality products requirement, the detect ability for large changes has been insufficient to meet the demand. Therefore, when the process has a small change, EWMA control chart or CUSUM control chart should be used to monitor the process. When the process is in-control, the average run length is hoped the bigger the better. On the contrary, when the process is out-control, the average run length is hoped the smaller the better. In this paper, we will explore and compare the detecting performance among the Shewhart, CUSUM and EWMA control charts under a variant of quality characteristics. Finally, seven conclusions are drawn for future studies and practical applications.

參考文獻


Albin, S. L.,Friedman, D. J.(1989).The impact of clustered defect distributions in IC fabrication.Management Sciences.35(9),1066-1078.
Abujiya, M. R.,Riaz, M.,Lee M. H.(2016).A new combined Shewhart-cumulative sum S chart for monitoring process standard deviation.Quality and Reliability Engineering International.32(3),1149-1165.
Borror, C. M.,Champ, C. W.,Rigdon, S. E.(1998).Poisson EWMA control charts.Journal of Quality Technology.30(4),352-361.
Brook, D.,Evans, D. A.(1972).An approach to the Probability distribution of cusum run length.Biometrika Trust.59(3),539-549.
Chen, C. W.(2012).Using geometric poisson exponentially weighted moving average control schemes in a compound Poisson production environment.Computers and Industrial Engineering.63,374-381.

延伸閱讀