System Tests for IEEE 1588 Standard Profile in Power System Applications

Wei Jiang ； Jun-Jie Yang ； Jason Gao

《Research Journal of Applied Sciences, Engineering and Technology》 7卷20期 (2014/05) Pp. 4191-4195

並列摘要

The main objective of this study is to establish the methods of system tests for the IEEE PC37.238 compliant devices. Aiming at the application in power system, a common profile called IEEE PC37.238 is defined in IEEE 1588 Precision Time Protocol (PTP). However, the standard doesn't provide specifications for system testing. In this study viable metrics and test methods are established to help to verify the ability of the substation network to meet the power industry's accuracy, reliability criteria defined in PC37.238. The test configurations and method implementations for measuring conformance are designed. Moreover, details on the tests for the path delay mechanism and BMC algorithm are given as an example in terms of testing methodology, procedures and analysis of the results.

並列關鍵字

IEEE 1588-2008 ； IEEE PC37.238 ； PTP ； system test