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An Electromagnetic Gauge Technique for Measuring Particle Velocity of Electrically Conductive Samples in Extreme Conditions

並列摘要


This paper presents an electromagnetic velocity (EMV) gauge technique which allowsuse of conductive samples in the measurement of material velocity subject to shockwave compression. A dynamic model of the induced current in the EMV gauge caused by the conductive samples moving in a uniform magnetic field is developed and the motional emf generated in the EMV gaugeis extracted from the measured signal. Experimental results are presented and discussed to demonstrate the effectiveness of the technique.

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