本篇文章簡單的介紹感應偶合電漿質譜儀(ICP-MS)的儀器原理、分析功能及限制,以反代表性的應用。與ICP原子放射光譜儀(AES)相比,ICP-MS有較好的偵測極限值,而且較不易受到光譜重疊的干擾。除此之外,ICP-MS可以在多元素分析的狀況下,測定微量成份的同位素比。
Instrumentation, analytical capabilities, limitations, and representative applications are described for inductively coupled plasma-mass spectrometry (ICP-MS). ICP-MS exhibits better detection limits and is potentially less susceptible to spectral overlap interferences than ICP atomic emission spectrometry. In addition, isotope ratio determinations are also feasible for trace constituents on a multielement basis by ICP-MS.