We have built a soft X-ray scanning photoemission microscope (SPEM) at SRRC with a spatial resolution of 0.15 um and electron energy resolution of 0.25 eV at present. With the unique combination of the bright synchrotron light source and wavelength tunability, SPEM can provide two-dimensional chemical analysis of nanostructured materials and elemental mapping of surface topography. The chemical and spatial information can be utilized for in-depth understanding of the structural characteristics as well as the basic interfacial reactions. In this report, we present some recent studies on the microchemistry of materials interfaces using SPEM. These include the scanning probe microscope induced surface oxidation, electron-beam and plasma assisted chemical modification of organic thin films, and the electronic structure at the tips of carbon nanotubes, etc. Representative experimental results are described and discussed, and the future prospect for the spectromicroscopy is given.