以近緣X光吸收細微結構光譜術及其顯微術研究有機薄膜材料的分子排列位向

Study of Molecular Orientation in Organic Thin Film Materials via Near-Edge X-ray Absorption Fine Structure Spectroscopy and Photoemission Electron Microscopy

范良任(Liang-Jen Fan) ； 許瑤真(Yao-Jane Hsu) ； 楊耀文(Yaw-Wen Yang)

《化學》 63卷1期 (2005/03) Pp. 131-140

https://doi.org/10.6623/chem.2005009

摘要

具有去區域化的π電子系統是有機薄膜電子材料的特徵，其中π電子術的相對排列位向可影響其電傳性質。近緣X光吸收細微結構光譜術(NEXAFS)與顯像式光電子能譜顯微術(PEEM)是兩種非常有用的同步輻射研究技術，它們可提供微區有機分子位向排列的資訊。我們探討三賽吩(terthiophene)衍生物結構上的的五環面如何隨表面覆蓋率的增加從水平轉為近垂直方向。也研究了聯五苯(pentacene)薄膜的成長基材從金表面更換成以對三聯苯甲硫醇預吸附的金表面時，苯環面方向如何從水平轉成垂直排列。

關鍵字

三賽吩(terthiophene)衍生物 ； 聯五苯(pentacene) ； 近緣Ｘ光吸收細微結構光譜術 ； 顯像式光電子能譜顯微鏡

並列摘要

Delocalized pi electron system is a key structural constituent of many functional organic electronic thin film materials, with their transport properties sensitively dependent on the orientation alignment of the pi rings. Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and photoemission electron microscopy (PEEM) are two powerful synchrotron-based research techniques that can provide extremely valuable information on the molecular orientation in organic thin films in a spatially-resolved manner. We investigate how the orientation of aromatic planes of the terthiophene derivatives grown on Au(111) is changed from the horizontal to near vertical as the surface coverage is increased toward saturation. We also report that the orientation of the aromatic plane of pentacene is altered from the horizontal to vertical as the substrate is replaced from a clean Au to a Au surface preadsorbed with p-terphenylmethanethiol monolayer.

並列關鍵字

terthiophene derivatives ； pentacene ； Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy ； Photoemission Electron Microscopy (PEEM)