Phase Extraction Technology Based on the Unequal-Step Phase Shift Method

Lan Xu ； Haibo Liang

《World Scientific Research Journal》 5卷8期 (2019/08) Pp. 1-11

https://doi.org/10.6911/WSRJ.201908_5(8).0001

摘要

In recent years, the rapid development of science and technology to promote industrial high-speed forward, optical three-dimensional measurement technology gradually forming, and applied to multi-industry multi-field. The use of optical projection of the three-dimensional measurement technology can achieve zero contact and high-speed and efficient measurement, recovery error is also small, high precision, so more experts and scholars will be put into its research. When the sine grating is projected onto the object to be measured, the light changes by the height of the points of the object to be measured, the deformed gratings are obtained. Phase measurement profiling use these deformed gratings which have the phase information to extract phase, then use the phase - height relationship to restore the three - dimensional surface of the object. The work of this paper is to study the phase extraction technique of three-step unequal phase shift method and five-step unequal step phase shift method. Firstly, the model and the deformed grating stripe modulated by the measured object and the measured object are established, and the phase is extracted by the three-step and five-step inequality algorithm to obtain the phase, and then the phase of each object to be measured is reconstructed by the phase-height relationship. Height information to restore the shape of the object being measured.

關鍵字

Optical three-dimensional measurement ； structured light projection ； phase measurement profilometry ； unequal step phase shift method

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